Pressure signal processing

ABSTRACT

A method includes receiving (S 1 ), from a touch panel ( 1 ), force values ( 23 ) corresponding to a plurality of piezoelectric sensors ( 5,6, 7 ), Each piezoelectric sensor corresponds to a physical location (xm, yn) on the touch panel. The method also includes receiving (S 2 ) one or more user touch locations corresponding to user touches, The method also includes excluding (S 5 ) all force values ( 23 ) corresponding to physical locations within a distance of a user touch location, and setting the remaining force values ( 23 ) as valid force values (S 5 ). The method also includes interpolating and/or extrapolating (S 6 ), based on the valid force values, one or more reconstructed force values ( 25 ) corresponding to same physical locations (xm, yn) as the respective excluded force values ( 23 ).

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation-in-part application of U.S.application Ser. No. 16/431/488, tiled Jun. 4, 2019 which further claimsthe benefit of priority from United Kingdom Patent Application No.GB1809318.7, filed on Jun. 6, 2018 and United Kingdom Patent ApplicationNo. GB1815617.4, filed on Sep. 25, 2018, each of which is herebyincorporated by reference in its entirety.

FIELD OF THE INVENTION

The present invention relates to processing signals from a touch panelfor piezoelectric pressure sensing or combined capacitive andpiezoelectric pressure sensing.

BACKGROUND

Resistive and capacitive touch panels are used as input devices forcomputers and mobile devices. One type of capacitive touch panel,projected capacitance touch panels, is often used for mobile devicesbecause an exterior layer may be Made of glass, providing a hard surfacewhich is resistant to scratching. An example of a projected capacitancetouch panel is described in US 2010/0079384 A1.

Projected capacitance touch panels operate by detecting changes inelectric fields caused by the proximity of a conductive object. Thelocation at which a projected capacitance touch panel is touched isoften determined using an array or grid of capacitive sensors. Althoughprojected capacitance touch panels can usually differentiate betweensingle-touch events and multi-touch events, they suffer the drawback ofnot being able to sense pressure. Thus, projected capacitance touchpanels tend to be unable to distinguish between a relatively light tapand a relatively heavy press, A touch panel that can sense pressure canallow a user to interact with a device in new ways by providingadditional information to simply position of a touch.

WO 2016/102975 A2 describes apparatus and methods for combinedcapacitance and pressure sensing in which a single signal is amplifiedthen subsequently separated into pressure and capacitance components. WO2017/109455 A1 describes apparatus and methods for combined capacitanceand pressure sensing in which a single signal is separated into acapacitance signal, and a pressure signal which is amplified.

Piezoelectric sensors generate transient signals, and there have beenattempts to develop methods for converting the transient piezoelectricsignals into signals which are representative of static applied forces.For example, WO 2017/122466 A1, JP 2015/097068 A and EP 2 902 886 A1describe methods for conditional integration of signals frompiezoelectric sensors.

SUMMARY

According to a first aspect of the invention, there is provided a methodincluding receiving, from a touch panel, force values corresponding to aplurality of piezoelectric sensors. Each piezoelectric sensorcorresponds to a physical location on the touch panel. The method alsoincludes receiving an identification of which, if any, of the forcevalues are influenced by coupling to external electric fields. Themethod also includes, in response to one or more force values beingidentified as influenced by coupling to external electric fields,setting the corresponding force values as excluded force values, andsetting the remaining force values as valid force values. The methodalso includes interpolating and/or extrapolating. based on the validforce values, one or more reconstructed force values corresponding tothe same physical locations as the respective excluded force values.

The valid force values and the reconstructed force values may be outputto a processor. The valid force values and the reconstructed forcevalues may be used as input to a software application.

Interpolating and/or extrapolating one or more. reconstructed forcevalues may include performing polynomial interpolation based on thevalid force values and the respective physical locations.

Polynomial interpolation may be performed using a Lagrange polynomialmethod, a Newton polynomial method, or any other suitable polynomialinterpolation method, for example a Neville polynomial method.

Interpolating and/or extrapolating one or more reconstructed forcevalues may include determining a set of interpolation locations. Thenumber of interpolation locations may be equal to the number of forcevalues received. The interpolation locations may have a higher spatialdensity towards the edges of the touch panel than the physicallocations. Interpolating and/or extrapolating one or more reconstructedforce values may include determining an estimated force value for someor all of the interpolation locations by interpolating or extrapolatingthe valid force values from two or more physical locations proximate toor spanning the interpolation location. Interpolating and/orextrapolating one or more reconstructed force values may includeperforming polynomial interpolation using the estimated force values andthe corresponding interpolation locations, and determining the one ormore reconstructed force values using the polymer interpolant.

The interpolation locations may be selected to mitigate Runge'sphenomenon. The interpolation locations may be determined as a number ofChebyshev points (also sometimes referred to as Chebyshev nodes) whichis equal to the number of force values received.

Determining an estimated force value for some or all of theinterpolation locations may include determining an estimated force valuefor every interpolation location.

Determining an estimated force value for some or all of theinterpolation locations may include determining an estimated force valuefor each interpolation location which is spanned by a pair of adjacentphysical locations which both correspond to valid force values, anddetermining an estimated force value for each interpolation locationwhich is within a predetermined distance of a physical locationcorresponding to a valid force value.

Determining an estimated force value for some or all of theinterpolation locations may include determining an estimated force valuefor each interpolation location which corresponds to a valid forcevalue. An interpolation location corresponds to a force value if theposition of the interpolation location within a sequence of all theinterpolation locations ordered by coordinate matches the position ofthe physical location associated with the force value within a sequenceof all the physical locations ordered by coordinate.

The method may also include receiving one or more touch locations whichcorrespond to the coordinates at which a user interacts with the touchpanel.

The method may also include, in response to a touch location is lessthan a predetermined distance from an edge of the touch panel,determining an estimated force value for every interpolation location.The method may also include, in response to a touch location is furtherthen a predetermined distance from an edge of the touch panel,determining an estimated force value for each interpolation locationwhich is spanned by a pair of adjacent physical locations which bothcorrespond to valid force values, or determining an estimated forcevalue for each interpolation location which corresponds to a valid forcevalue.

Each estimated force value may be determined by: a) performing a linearinterpolation based on a first physical location which corresponds to avalid force value, and a second physical location which is the closestphysical location preceding the first physical location andcorresponding to a valid force value; or b) performing a linearinterpolation based on the first physical location and a third physicallocation which is the closest physical location following the firstphysical location and corresponding to a valid force value.

The first physical location may be the physical location of a validforce value which corresponds to, or is closest to, the interpolationlocation, The selection of steps a) or b) may be made in dependence uponcomparing a cost function calculated for the first and second physicallocations with a cost function calculated for the first and thirdlocations,

The term preceding may mean that the second location has a lower valuethan the first physical location with respect to a given coordinatesystem. The term following may mean that the third location has agreater value than the first physical location with respect to a givencoordinate system.

The cost function may be selected from the group:

$C_{1} = {\sqrt{\left( {P_{b} - P_{a}} \right)^{2} + \left( {x_{b} - x_{a}} \right)^{2}} + C_{std}}$$C_{2} = {{{x_{b} - x_{int}}} \times \left( {1 + \frac{{x_{a} - x_{int}}}{{x_{b} - x_{a}}}} \right)}$$C_{3} = {{{x_{a} - x_{int}}} \times \left( {{\frac{P_{b} - P_{a}}{x_{b} - x_{a}}} + {{x_{b} - x_{a}}}} \right)}$$C_{4} = {{{x_{a} - x_{int}}} \times \left( {{\frac{P_{b} - P_{a}}{x_{b} - x_{a}}} + {{x_{b} - x_{a}}} + {\max\left\{ {{{x_{b} - x_{int}}},1} \right\}}} \right)}$C₅ = P_(b) − P_(a) × x_(a) − x_(int)$C_{6} = {{\left( {{{x_{a} - x_{int}}} + {{x_{b} - x_{a}}}} \right) \times {\frac{P_{b} - P_{a}}{x_{b} - x_{a}}}} + C_{std}}$$C_{7} = {{{x_{a} - x_{int}}} \times C_{std} \times {\frac{P_{b} - P_{a}}{x_{b} - x_{a}}}}$$C_{8} = {{{{x_{a} - x_{int}}} \times {\frac{P_{b} - P_{a}}{x_{b} - x_{a}}}} + C_{std}}$C₉ = P_(b) − P_(a)$C_{10} = {{{x_{b} - x_{int}}} \times \max\left\{ {\frac{{x_{a} - x_{int}}}{{x_{b} - x_{a}}},\frac{{x_{b} - x_{int}}}{{x_{b} - x_{a}}},1} \right\}}$

In which C₁ to C₁₀ are first to tenth cost functions, P_(a) is a firstvalid force value input corresponding to physical location x_(a), P_(b)is a second valid force value input corresponding to physical locationx_(b), x_(int) is the interpolation location, and C_(std) is a standardcost calculated according to:C_(std)=max{|x _(b) −x _(int)|,1}

Each estimated force value may be determined based on calculatingquadratic or cubic splines connecting two or more physical locationsspanning the interpolation location. Each estimated force value may bedetermined based on calculating and extrapolating quadratic or cubicsplines connecting two or more physical locations proximate to theinterpolation location.

A first physical location may be a physical location of a valid forcevalue which corresponds to, or is closest to, an interpolation location.Each estimated force value may be determined by: a) performing a linearinterpolation based on a first pair of physical locations which areclosest to the first physical location in any direction; or b)performing a linear interpolation based on a second pair of physicallocations corresponding to the physical location which or to a validpressure value immediately preceding the first physical location, andthe physical location which corresponds to a valid pressure valueimmediately following the first physical location.

The selection of steps a) or b) may be made in dependence upon comparinga cost function calculated for the first pair of physical locations witha cost function calculated for the second pair of physical locations.

The first pair of physical locations may exclude the first physicallocation. The second pair of physical locations may exclude the firstphysical location, Any ambiguity in selecting the first and/or secondpairs of physical locations may be resolved based on the interpolationlocation.

Interpolating and/or extrapolating one or more reconstructed forcevalues may include fitting a force value model to the valid force valuesand the respective physical locations. The fitting may be a leastsquares fitting.

Interpolating and/or extrapolating one or more reconstructed forcevalues may include determining a spline interpolant passing through eachof the valid force values and the respective physical locations. Thespline interpolant may be quadratic or cubic. The spline may use linearinterpolation for locations proximate to an edge of the touch panel, andhigher order interpolation elsewhere.

Receiving an identification of which, if any, of the force values areinfluenced by coupling to external electric fields may includedetermining which, if any, of the force values are influenced bycoupling to external electric fields.

Determining which, if any, of the force values are influenced bycoupling to external electric fields may include, for each force value,flagging the force value as influenced by coupling to external electricfields if the force value exceeds a pre-determined value threshold.

Determining which, if any, of the force values are influenced bycoupling to external electric fields may include calculating a spatialgradient corresponding to each force value, based on the plurality offorce values and the respective physical locations, and for each forcevalue, in response to the corresponding spatial gradient exceeds apre-determined spatial gradient threshold, flagging the force value asinfluenced by coupling to external electric fields.

Determining which, if any, of the force values are influenced bycoupling to external electric fields may include calculating a temporalgradient corresponding to each force value, based on the currentlymeasured force value and a buffer storing previously measured forcevalues, and for each force value, in response to the correspondingtemporal gradient exceeds a predetermined temporal gradient threshold,flagging the force value as influenced iv coupling to external electricfields.

The plurality of piezoelectric sensors may include a layer ofpiezoelectric material disposed between a plurality of sensingelectrodes and at least one common electrode, Each piezoelectric sensormay be formed of a sensing electrode and a common electrode. The methodmay also include receiving an external interference signal which is asum over signals received from all of the sensing electrodes and the, oreach, common electrode. Determining which, if any, of the force valuesare influenced by coupling to external electric fields may includecomparing the external interference signal against a pre-determinedexternal interference threshold.

In response to the external interference signal exceeds thepre-determined external interference threshold, a global flag may be setto indicate that the force values are affected by coupling to externalelectric fields.

The method may include receiving one or more locations corresponding touser touches. The one or more locations may be determined usingcapacitive touch information. Determining which, if any, of the forcevalues are influenced by coupling to external electric fields mayinclude, in response to the global flag being set, excluding all forcevalues corresponding to physical locations with a predetermined distanceof a user touch location.

The value of one or more of the value threshold, the spatial gradientthreshold and/or the temporal gradient threshold may be a first value inresponse to the global flag being set and second value in in response tothe global flag being unset.

According to a second aspect of the invention, there is provided acomputer program stored on a non-transitory computer readable medium andincluding instructions for causing a data processing apparatus toexecute the method.

According to a third aspect of the invention, there is providedapparatus configured to carry out the method.

According to a fourth aspect of the invention, there is providedapparatus configured to receive force values corresponding to aplurality of piezoelectric sensors. Each piezoelectric sensorcorresponds to a physical location on a touch panel, The apparatus isalso configured to receive an identification of which, if any, of theforce values are influenced by coupling to external electric fields. Theapparatus is also configured, in response to one or more force valuesbeing identified as influenced by coupling to external electric fields,to set the corresponding force values as excluded force values, and toset the remaining force values as valid force values. The apparatus isalso configured to interpolate and/or extrapolate, based on the validforce values, one or more reconstructed force values corresponding tothe same physical locations as the respective excluded force values.

The apparatus may be configured to receive signals from the plurality ofpiezoelectric sensors. The apparatus may be further configured togenerate the force values based on the received signals, each forcevalue corresponding to one piezoelectric sensor or to two or moreadjacent piezoelectric sensors.

A system may include the apparatus, and a touch panel comprising aplurality of piezoelectric sensors. The touch panel may also include aplurality of capacitance sensors. The touch panel may be a touch panelfor combined piezoelectric pressure and capacitance measurements. Thetouch panel may include a layer of piezoelectric material disposedbetween a plurality of sensing electrodes and at least one commonelectrode. The apparatus may be further configured to generatecapacitance values and force values based on signals received from thesensing electrodes.

According to a fifth aspect of the invention, there is provided a methodincluding receiving, from a touch panel, force values corresponding to aplurality of piezoelectric sensors. Each piezoelectric sensorcorresponds to a physical location on the touch panel. The method alsoincludes receiving one or more user touch locations corresponding touser touches. The method also includes excluding all force valuescorresponding to physical locations within a distance of a user touchlocation, and setting the remaining force values as valid force values.The method also includes interpolating and/or extrapolating, based onthe valid force values, one. or more reconstructed force valuescorresponding to the same physical locations as the respective excludedforce values.

The method according to the fifth aspect may include featurescorresponding to any features of the first second, third and/or fourthaspects of the invention.

Receiving the one or more user touch locations may include receiving,from the touch panel, capacitive touch information, and determining theone or more locations corresponding to user touches based on thecapacitive touch information.

Receiving the one or more user touch locations may include determiningthe one or more locations corresponding to user touches based onpressure signals received from the plurality of piezoelectric sensors.

The plurality of piezoelectric sensors may include a layer ofpiezoelectric material disposed between a plurality of sensingelectrodes and at least one common electrode. Each piezoelectric sensormay be formed of a sensing electrode and a common electrode. The methodmay also include receiving an external interference signal which is asum over signals received from all of the sensing electrodes and the, oreach, common electrode. The method may also include, in response to theexternal interference signal exceeds a pre-determined externalinterference threshold, setting a global flag, The method may alsoinclude, in response to the global flag being set, excluding all forcevalues corresponding to physical locations with a predetermined distanceof a user touch location.

The distance may be a predetermined distance. The distance may be adynamically determined distance.

According to a sixth aspect of the invention there is provided apparatusconfigured to receive force values corresponding to a plurality ofpiezoelectric sensors. Each piezoelectric sensor corresponds to aphysical location on a touch panel. The apparatus is also configured toreceive one or more user touch locations corresponding to user touches.The apparatus is also configured to exclude all force valuescorresponding to physical locations within a distance of a user touchlocation, and to set the remaining force values as valid force values.The apparatus is also configured to interpolate and/or extrapolate,based on the valid force values, one or more reconstructed force valuescorresponding to the same physical locations as the respective excludedforce values.

The method according to the sixth aspect may include featurescorresponding to any features of the first, second, third, fourth and/orfifth aspects of the invention.

Receiving the one or more user touch locations may include receiving,from the touch panel, capacitive touch information, and determining theone or more locations corresponding to user touches based on thecapacitive touch information.

Receiving the one or more user touch locations may include determiningthe one or more locations corresponding to user touches based onpressure signals received from the plurality of piezoelectric sensors.

The plurality of piezoelectric sensors may include a layer ofpiezoelectric material disposed between a plurality of sensingelectrodes and at least one common electrode. Each piezoelectric sensormay be formed of a sensing electrode and a common electrode. Theapparatus may also be configured to receive an external interferencesignal which is a sum over signals received from all of the sensingelectrodes and the, or each, common electrode. The apparatus may also beconfigured, in response to the external interference signal exceeds apre-determined external interference threshold, to set a global flag.The apparatus may also be configured, in response to the global flagbeing set, to exclude all force values corresponding to physicallocations with a predetermined distance of a user touch location. Thedistance may be a predetermined distance. The distance may be adynamically determined distance.

A system may include the apparatus according to the sixth aspect, and atouch panel comprising a plurality of piezoelectric. sensors. The touchpanel may also include a plurality of capacitance sensors. The touchpanel may be a touch panel for combined piezoelectric pressure andcapacitance measurements. The touch panel may include a layer ofpiezoelectric material disposed between a plurality of sensingelectrodes and at least one common electrode. The apparatus may befurther configured to generate capacitance values and force values basedon signals received from the sensing electrodes.

BRIEF DESCRIPTION OF THE DRAWINGS

Certain embodiments of the present invention will now be described, byway of example, with reference to the accompanying drawings in which:

FIG. 1 is a cross-section of a touch panel for piezoelectric pressuremeasurements or combined capacitive and piezoelectric pressuremeasurements;

FIG. 2 schematically illustrates an apparatus for piezoelectric pressuremeasurements or combined capacitance and piezoelectric pressuremeasurements;

FIG. 3 illustrates a force input applied to a touch panel;

FIG. 4 illustrates a piezoelectric pressure signal corresponding to theforce input illustrated in FIG. 3;

FIG. 5 plots an example of a measured piezoelectric pressure signal;

FIG. 6 plots force values obtained from the measured piezoelectricpressure signal plotted in FIG. 5;

FIG. 7 is a process flow diagram of a first method of correcting forcevalues to reduce or remove the influence of coupling to externalelectric fields;

FIG. 8 illustrates a set of force values, including a subset of excludedforce values;

FIG. 9 illustrates reconstructed force values estimated to replace theexcluded force values illustrated in FIG. 8;

FIG. 10 is a process flow diagram of a second method of correcting forcevalues to reduce or remove the influence of coupling to externalelectric fields;

FIG. 11 illustrates a transformation from a set of equi-spaced physicallocations to a set of interpolation locations;

FIG. 12 illustrates determining estimated force values corresponding toa set of interpolation locations;

FIG. 13 plots a comparison of measured force values againstreconstructed force values determined using Lagrange polynomialinterpolation using a first set of interpolation locations;

FIG. 14 plots the measured force values from FIG. 13 againstreconstructed force values determined using Lagrange polynomialinterpolation using a second set of interpolation locations;

FIG. 15 plots the measured force values from FIG. 13 againstreconstructed force values determined using Lagrange polynomialinterpolation using the second set of interpolation locations, and adifferent method of estimating force values at the interpolationlocations compared to FIG. 14;

FIG. 16 plots the measured force values from FIG. 13 againstreconstructed force values determined using a cubic spline interpolant;

FIG. 17 plots a comparison of the reconstructed force values plotted inFIGS. 13 to 16;

FIG. 18 is the same as FIG. 17, except that the data plotted correspondsto a different user interaction;

FIG. 19 plots a measured piezoelectric pressure signal and thecorresponding force values against time, for a user interaction whichwas not influenced by coupling to external electric fields;

FIG. 20 plots a measured piezoelectric pressure signal, thecorresponding force values, and a set of reconstructed force valuesagainst time, for a user interaction which was influenced by coupling toexternal electric fields;

FIG. 21 plots a comparison of reconstructed force values obtained usingLagrange polynomial interpolation using first and second sets ofinterpolation locations, and obtained using a cubic spline interpolant;

FIG. 22 plots a comparison of force values with reconstructed forcevalues obtained using Lagrange polynomial interpolation using first andsecond sets of interpolation locations, and obtained using a cubicspline interpolant;

FIG. 23 illustrates a simplified representation of interference couplingbetween an object and the electrodes of a touch panel; and

FIG. 24 is a simplified schematic which illustrates the conversion intovoltage signals of charges induced on sensing electrodes and commonelectrode(s) of a touch panel.

DETAILED DESCRIPTION

In the following description, like parts are denoted by like referencenumerals.

In some circumstances, a variety of unwanted signals may couple via auser's digit or conductive stylus to the sensing electrodes of apiezoelectric pressure sensing touch panel or a combined capacitance andpiezoelectric pressure sensing touch panel. Such signals may beamplified along with the desired piezoelectric pressure signals, and maybe of comparable or larger amplitude than the desired piezoelectricpressure signals. For example a user's digit placed on a piezoelectricpressure sensing touch panel or a combined capacitance and piezoelectricpressure sensing touch panel sensor may couple mains interference intothe sensing electrodes, Additionally or alternatively, a user may becomecharged with static electricity, which may couple to the sensingelectrodes of a piezoelectric pressure sensing touch panel or a combinedcapacitance and piezoelectric pressure sensing touch panel. The presentspecification is concerned with signal post-processing methods intendedto reduce or remove the effects of such unwanted signals, in order toallow more accurate measurements of a force or forces applied to apiezoelectric pressure sensing touch panel or a combined capacitance andpiezoelectric pressure sensing touch panel by one or more userinteractions.

Herein, the term “user interaction” may refer to a user touching orpressing a touch panel 1 (FIG. 1) or a layer of material overlying atouch panel. A user interaction may involve a user's digit or a stylus(whether conductive or not). A touch interaction may include a user'sdigit or conductive stylus being proximate to the touch panel 1 (FIG. 1)without direct physical contact or without applying significant force. Apress interaction involves a user pressing the touch panel 1 (FIG. 1)with sufficient force to cause straining of a layer of piezoelectricmaterial and generation of a piezoelectric response. The location of auser interaction may change with time as a user moves a digit or stylus.The methods of the present specification may be applied to themeasurement and tracking of one or more concurrent user interactions,sometimes referred to as “multi-touch” interactions.

Referring to FIG. 1, an example of a touch panel 1 for piezoelectricpressure measurements or combined capacitive and piezoelectric pressuremeasurements is shown.

The touch panel 1 includes a first layer structure 2 having a first face3 and a second, opposite, face 4. A number of first sensing electrodes 5are disposed on the first face 3 of the first layer structure 2. Each ofthe first sensing electrodes 5 extends (or equivalently is elongated) ina first direction x, and the first sensing electrodes 5 are spaced apartin a second direction y. A common electrode 6 is disposed tosubstantially cover the second face 4 of the first layer structure 2.

The first layer structure 2 includes one or more layers, including atleast a layer of piezoelectric material 7. Each layer included in thefirst layer structure 2 is generally planar and extends in first, x, andsecond, y, directions which are perpendicular to a thickness directionz, The one or more layers of the first layer structure 2 are arrangedbetween the first and second faces 3, 4 such that the thicknessdirection z of each layer of the first layer structure 2 issubstantially perpendicular to the first and second faces 3, 4.

The touch panel 1 also includes a second layer structure 8 having afirst face 9 and a second, opposite, face 10. A number of second sensingelectrodes 11 are disposed on the first face 9 of the second layerstructure 8. Each of the second sensing electrodes 11 extends (orequivalently is elongated) in the second direction y, and the secondsensing electrodes it are spaced apart in the first direction x.

The second layer structure S includes one or more dielectric layers 12.Each dielectric layer 12 is generally planar and extends in first, x,and second, y, directions which are perpendicular to a thicknessdirection z. The one or more dielectric layers 12 of the second layerstructure 8 are arranged between the first and second faces 9, 10 of thesecond layer structure 8 such that the thickness direction z of eachdielectric layer 12 of the second layer structure 8 is perpendicular tothe first and second faces 9, 10.

Preferably, the layer of piezoelectric material 7 includes or is formedof a piezoelectric polymer such as polyvinylidene fluoride (PVDF) orpolylactic acid. However, the layer of piezoelectric material mayalternatively be a layer of a piezoelectric ceramic such as leadzirconate titanate (PZT). Preferably, the first and second sensingelectrodes 5, 11, and the common electrode 6 are formed from silvernanowires. However, the first and second sensing electrodes 5, 11, andthe common electrode 6 may alternatively be formed of transparentconductive oxides such as indium tin oxide (ITO) or indium zinc oxide(IZO), The first and second sensing electrodes 5, 11, and the commonelectrode 6 may be metal films such as aluminium, copper, silver orother metals suitable for deposition and patterning as a thin film. Thefirst and second sensing electrodes 5, 11, and the common electrode 6may be conductive polymers such as polyaniline, polythiphene,polypyrrole or poly(3,4-ethylenedioxythiophene) polystyrene sulfonate(PEDOT/PSS). The first and second sensing electrodes 5, 11, and thecommon electrode 6 may be formed from a metal mesh, metallic nanowires,graphene, and/or carbon nanotubes. The dielectric layer(s) 12 mayinclude layers of a polymer dielectric material such as polyethyleneterephthalate (PET) and/or layers of pressure sensitive adhesive (PSA)materials, However, the dielectric layer(s) 12 may include layers of aceramic insulating material such as aluminium oxide.

The first layer structure 2 may include only the layer of piezoelectricmaterial 7 such that the first and second opposite faces 3, 4 are facesof the layer of piezoelectric material 7. Alternatively, the first layerstructure 2 may include one or more dielectric layers 12 which arestacked between the layer of piezoelectric material 7 and the first face3 of the first layer structure 2. The first layer structure 2 mayadditionally or alternatively include one or more dielectric layers 12stacked between the second face 4 of the first layer structure 2 and thelayer of piezoelectric material 7.

The second layer structure 8 may include only a single dielectric layer12, such that the first and second faces 9, 10 of the second layerstructure 8 are faces of a single dielectric layer 12. Alternatively, asecond layer structure 8 need not be used, and the second sensingelectrodes 11 may be disposed on the first face 3 along with the firstsensing electrodes 5.

in FIG. 1, the touch panel a has been shown with reference to orthogonalaxes labelled x, y, and z. However, the first, second and thicknessdirections need not form a right handed orthogonal set. In otherexamples, the first sensing electrodes 5 may be elongated in the second,y, direction and the second sensing electrodes 11 may be elongated inthe first, x, direction.

Referring also to FIG. 2, an example of apparatus 13 for piezoelectricpressure measurements or combined capacitance and piezoelectric pressuremeasurements is shown.

The apparatus 13 includes the touch panel 13 a first circuit 14, acontroller 15, a post-processing module 16, and optionally a secondcircuit 17. Each of the first and second sensing electrodes 5, 11 isconnected to the first circuit 14 by a corresponding conductive trace18. When present, the second circuit 17 is connected to the commonelectrode 6.

In some examples, the first circuit 14, controller 15, post-processingmodule 16 and, optionally, the second circuit 17, may each be providedas separate components. However, in other examples, the first circuit14, controller 15, post-processing module 16 and, optionally, the secondcircuit 17, may all be provided by a single component. For example asingle microcontroller, application specific integrated circuit,processor, and so forth. In still further examples, the functions of thefirst circuit 14, controller 15, post-processing module 16 and,optionally, the second circuit 17, may be divided between a touchcontroller (not shown) and a central processor or processors (not shown)of a device (not shown) incorporating the apparatus 13.

The first circuit 14 receives from and/or transmits signals to the firstand second sensing electrodes 5, 11. The first circuit 14 measures firstpiezoelectric pressure signals 19. The first circuit 14 is connectableto each of the first and second sensing electrodes 5, 11, in groups orindividually. Each first piezoelectric pressure signal 19 corresponds toone or more of the first or second sensing electrodes 5, 11, and eachfirst piezoelectric pressure signal 19 is indicative of a pressureacting on the touch panel 1 proximate to the respective first or secondsensing electrodes 5, 11. For example, the first circuit 14 may measureor generate a first piezoelectric pressure signal 19 corresponding toeach first sensing electrode 5 and a first piezoelectric pressure signal19 corresponding to each second sensing electrode 11. Alternatively,each first piezoelectric pressure signal 19 may correspond to a pair ofadjacent first or second sensing electrodes 5, 11, and so forth. Eachsensing electrode 5, 11 contributes to one of the first piezoelectricpressure signals 19.

Optionally, the first circuit 14 may also measure mutual capacitancesignals 20 corresponding to each intersection 21 of the first and secondsensing electrodes 5, 11. In other examples, the first circuit 14 mayinstead measure self-capacitance signals corresponding to each firstand/or second sensing electrode 5, 11. The first circuit 14 maydetermine the capacitance signals 20 and the first piezoelectricpressure signals 19 concurrently. Alternatively, the first circuit 14may alternate between determining the capacitance signals 20 and thefirst piezoelectric pressure signals 19.

For example, the first circuit 14 may be configured for combinedcapacitance and piezoelectric pressure measurements as described in WO2016/102975 A2, the entire contents of which are incorporated herein byreference. In particular, the first circuit 14 may be configured asdescribed in relation to examples shown FIGS. 21 to 26 of WO 2016/102975A2. Alternatively, the first circuit 14 may be configured for combinedcapacitance and piezoelectric pressure measurements as described in WO2017/109455 the entire contents of which are incorporated herein byreference. In particular, the first circuit 14 may be configured asdescribed in relation to examples shown in FIGS. 4 to 21 of WO2017/109455 A1.

However, the methods of the present specification are not limited tothese examples, and are applicable to any first circuit 14 which iscapable of providing the hereinbefore described functions.

When present, the optional second circuit 17 measures a secondpiezoelectric pressure signal 22 which corresponds to the commonelectrode 6. The second piezoelectric signal 22 should be indicative ofa total pressure applied to the touch panel 1. When more than one commonelectrode 6 is used, a second piezoelectric signal 22 may be generatedcorresponding to each common electrode 6, for subsequent summation bythe controller 15. Alternatively, when more than one common electrode 6is used, the second circuit 17 may generate a single secondpiezoelectric signal 17 based on charges induced on all of the commonelectrodes 6. Under ideal conditions and in the absence of externalinterference, a sum over the second piezoelectric pressure signal(s) 22and the first piezoelectric signals 19 should be approximately zero (upto a measurement error) because the sensing electrodes 5, 11 and thecommon electrode(s) 6 are arranged on opposite sides of any polarisationP induced within the layer of piezoelectric material 7.

The first piezoelectric pressure signal 19, and optionally the secondpiezoelectric pressure signal(s) 22 and/or the capacitance signals 20,are produced in response to a user interaction with the touch panel 1,or with a layer of material overlying the touch panel 1.

The controller 15 receives the first piezoelectric pressure signals 19and integrates them to generate corresponding force values 23. Ineffect, each pairing of one sensing electrode 5, 11 with the underlyingcommon electrode 6 constitutes a separate piezoelectric sensor. Anexample of integrating the first piezoelectric pressure signals 19 togenerate force values 23 shall be explained hereinafter with referenceto FIGS. 3 to 6. The controller 15 also generates an identification 24of which, if any, of the force values 23 are influenced by coupling toexternal electric fields. If any of the force values 23 are influencedby coupling to external electric fields, then the methods of the presentspecification may be applied to reduce or remove the effects, so as toobtain a better estimate of one or more forces applied by a userinteraction. Examples of methods for determining which, if any, of theforce values 23 are influenced by coupling to external electric fieldsare described hereinafter.

The post-processing module 16 receives the force values 23, each ofwhich corresponds to one of the piezoelectric sensors provided by a pairof one or more sensing electrodes 5, 11 and the common electrode 6. Inthis way, each force value corresponds to a physical location on thetouch panel 1. The post-processing module 16 also receives theidentification 24 of which, if any, of the force values 23 areinfluenced by coupling to external electric fields. The post-processingmodule is configured, in response to one or more force values 23 beingidentified as influenced by coupling to external electric fields, to setthe corresponding force values 23 as excluded force values 23 b (FIG.8), and to set the remaining force values 23 as valid force values 23 a.The post-processing module 16 determines one or more reconstructed forcevalues 25 corresponding to the same physical locations as the respectiveexcluded force values 23 b (FIG. 8), based on interpolating and/orextrapolating the valid force values 23 a and corresponding physicallocations. The valid force values 23 a and the reconstructed forcevalues 25 may be output to one or more. processors (not shown) of adevice (not shown) incorporating the apparatus 13. The valid forcevalues 23 a and the reconstructed force values 25 may be used as inputto a software application (not shown) being executed by a deviceincorporating the apparatus 13.

In some examples, when the apparatus 13 includes the second circuit 16,the controller 15 may also receive the second piezoelectric pressuresignal 22, and may sum the second piezoelectric pressure signal 22 withall of the first piezoelectric pressure signals 19 to generate anexternal interference index 26. The external interference index 26 maybe a simple sum over the unweighted first and second piezoelectricpressure signals 19, 22, or, the external interference index 26 may be aweighted sum over the first and second piezoelectric pressure signals19, 22. The controller 15 may be configured to generate the indication24 at least in part based on a comparison of the external interferenceindex 26 against a pre-calibrated threshold (for example Vthresh).Optionally, the external interference index 26 may also be output to thepost-processing module 16 to provide an indication of the magnitude ofexternal interference.

Optionally, the controller 15 may also relay the raw first and/or secondpiezoelectric pressure signals 19, 22 to the post-processing module 16and/or to the one or more processors (not shown) which operate a deviceincorporating the apparatus 13.

In some examples, the controller 15 may also determine touch locationdata 27 based on the first pressure signals 19, and optionally thesecond pressure signals 22. The touch location data 27 indicates thelocation, for example x, y coordinates, of one or more userinteractions. When determined, the touch location data 27 may be outputto the post-processing module 16 and/or to the one or more processors(not shown) which operate a device incorporating the apparatus 13. Inother examples, the touch location data 27 may be determined by thepost-processing module 16.

When measured, the controller 15 receives the capacitance signals 20 andeither relays them to the one or more processors (not shown) whichoperate the device incorporating the apparatus 13, or performs furtherprocessing of the capacitance values 20. For example, the controller 15may process the capacitance signals 20 to generate or contribute togenerating the touch location data 27. Capacitance signals 20 may permitmore accurate determination of the touch location data 27 than the firstsignals 19 alone. Capacitance signals 20 may also be used in the processof generating the force values 23.

Functions of the controller 15 and post-processer 16 may be distributedbetween these two elements in any manner which is compatible with thenecessary ordering of the processing steps. The controller 15 andpost-processing module 16 may be combined as a single element. All ofthe functions of the controller 15 and post-processing module 16 may beprovided by one or more processors (not shown) of a device (not shown)incorporating the apparatus 13.

Before describing the methods for reducing or removing the influence ofcoupling to external electric fields, it may be helpful to brieflydescribe an example of integrating the piezoelectric pressure signals19, 22 to produce corresponding force values 23.

Referring also to FIG. 3 an applied force input 28 to a touch panel 1 isschematically illustrated.

Referring also to FIG. 4, an idealised piezoelectric pressure signal 29corresponding to the force input 28 is shown.

The layer of piezoelectric material 7 is poled and becomes polarisedwith a polarisation P in response to straining caused by a userinteraction which applies sufficient force. The polarisation P of thelayer of piezoelectric material 7 results in a corresponding chargeQ_(piezo)(t) being developed between the common electrode 6 and thesensing electrodes 5, 11. The straining which produces the polarisationP may result from a compression or a tension. The straining whichproduces the polarisation P may be an in-plane stretching of thepiezoelectric material layer 7. Intimate contact between the layer ofpiezoelectric material 7 and the sensing electrodes 5, 11 is notrequired. Generally, a greater straining of the layer of piezoelectricmaterial 7 (caused b a more forceful user interaction) will result in agreater polarisation P, and a correspondingly larger magnitude of thecharge difference ΔQ_(piezo) induced on the sensing electrodes 5, 11. Apiezoelectric response I_(piezo)(t), which is the current associatedwith the charge Q_(piezo)(t), may be amplified and/or integrated todetermine the first and second piezoelectric pressure signals 19, 22.The idealised piezoelectric pressure signal 29 may correspond to a firstor second piezoelectric pressure signal 19, 22,

The piezoelectric pressure signals 19, 22, 29, for example as outputfrom the first or second circuits 14, 17, are fundamentally transientsignals. The induced piezoelectric voltages decay with time due toleakage currents. Moreover, the output of an integrating chargeamplifier, which may be included in the first or second circuits 14 toamplify a piezoelectric current I_(piezo), also decays with time.

For example, during a first loading period, t_(o)≤t≤t₁, the force 28increases steadily from zero to a first applied force value F₁. Providedthat the rate of increase of the applied input force 28 is fast comparedto the rate of decay of the corresponding piezoelectric pressure signal29, the piezoelectric pressure signal 29 decreases steadily during thefirst loading period t_(o)≤t≤t₁, reaching a first peak value of V, asthe force 28 reaches the first applied force value F₁. The applied inputforce 28 is then held constant at F₁ for a first holding period,t₁<t≤t₂. During the first holding period, t₁<t≤t₂, the piezoelectricpressure signal 29 decays upwards from the first peak value V₁ towards,in the ideal case, zero DC offset.

The applied input force 28 increases again from the first applied forcevalue F₁ to a second applied force value F₂ during a second loadingperiod t₂<t≤t₃. Provided that the rate of increase of the applied inputforce 28 is fast compared to the rate of decay of the correspondingpiezoelectric pressure signal 29, the piezoelectric pressure signal 29decreases steadily during the second loading period t₂<t≤t₃, reaching asecond peak value of V₂ as the force 28 reaches the second applied forcevalue F₂. The applied input force 28 is then held constant at F₂ for asecond holding period, t₃<t<t≤t₄. During the second holding period,t₃<t≤t₄,the piezoelectric pressure signal 29 decays upwards from thesecond peak value V₂ towards, in the ideal case, zero signal.

At the end of the second holding period, t₃<t≤t₄, the user interactionsends with the release of the applied input force 28 during an unloadingperiod t₄<t≤t₃. Provided that the rate of decrease of the applied inputforce 28 is fast compared to the rate of decay of the correspondingpiezoelectric pressure signal 29, the piezoelectric pressure signal 29increases steadily during the unloading period t₄<t≤t₅, reaching a thirdpeak value V₃, as the force 28 reaches zero. The third peak value V₃,resulting from unloading rather than loading, has opposite sign to thefirst and second peak values V₁, V₂. After the end of the userinteraction, the piezoelectric pressure signal 29 decays towards, in theideal case, zero DC offset. Although FIG. 4 illustrates the idealisedpiezoelectric pressure signal 29 becoming negative in response toloading and positive in response to unloading, the polarity of thepiezoelectric pressure signal 29 may be reversed in other examples,depending on the configuration of the touch panel 1 and apparatus 13.

When the piezoelectric pressure signal 29 is ideal, or approximatelyideal, as illustrated in FIG. 4, the decay of the piezoelectric pressuresignal 29 may be compensated for by various methods such as, forexample, conditional integration of the piezoelectric pressure signal 29based on the gradient and/or values of the piezoelectric pressure signal29. By integrating the piezoelectric pressure signal 29 when thegradient and value of the piezoelectric pressure signal 29 are the samesign, an estimated measurement proportional to the applied force 28 maybe recovered.

However, when a touch panel 1 and apparatus 13 for combined pressure andcapacitance measurements is used, piezoelectric pressure signals 19, 22,29 may in practice be subjected to continuous variations in DC offsetsand significant sources of noise which may prevent the reliableoperation of naive value and gradient based conditional integrations.Although not directly linked to the methods of the presentspecification, which may be applied to measured force values 23howsoever obtained, potential sources of noise, external electric fieldcoupling and an example method of integrating the piezoelectric pressuresignals 9, 22, 29 to obtain force values 23 shall be briefly discussedas context for the methods of the present specification.

The touch panel 1 and apparatus 13 may often he installed in a handheld,battery operated electronic device (not shown). Such devices aretypically ungrounded, or only weakly grounded, which may increase thesusceptibility to noise pickup and to variations in DC offsets.Additionally, a user may frequently become charged with staticelectricity as a result of interactions between their clothing, footwearand/or their environment. This may further contribute to variations inDC offsets, and may also result in electrostatic coupling between theuser's digit and/or stylus upon an initial contact with the touch panel1. Such electrostatic coupling, can induce charges to the sensingelectrodes 5, 11 close to a user interaction which may equal, or evensubstantially exceed, charges Q_(piezo) resulting from applied forces.Furthermore, short interactions such as tapping a touch panel 1 in rapidsuccession may confuse gradient and value based approaches because thesignal from one tap may not have completely decayed before the next tapcommences, leading to inaccurate measurements of forces. The precedingdiscussion is not exhaustive, and many additional factors may contributeto DC offset variations and noise levels of a touch panel 1 andapparatus 13. One method of obtaining force values 23 from the receivedpiezoelectric pressure signals 19, 22, 29 shall be briefly summarised.

Referring also to FIG. 5, an example of a measured piezoelectricpressure signal 30 obtained using an example of the touch panel 1 andapparatus 13 is shown. The measured piezoelectric pressure signal 30 mayrepresent a first or second piezoelectric pressure signal 19, 22.

Referring also to FIG. 6, measured force values 23 are shown whichcorrespond to the measured piezoelectric pressure signal 30 shown inFIG. 5.

It may be observed that a measured piezoelectric pressure signal 30 maydeviate from the idealised piezoelectric pressure signal 29 in severalways. Firstly, the start of a user interaction, for example determinedusing capacitance signals 20, may occur when the pressure signal 30values, P(t), are not at zero DC offset. Instead, at a time t=o withrespect to the beginning of the user interaction, the pressure signal 30values P(t) may often display an initial DC offset value P₀=P(O). Thismay occur for a variety of reasons such as, for example, a residual DCoffset following a prior user interaction, a repeated touch before asignal from a prior user interaction has fully decayed, and so forth.The initial offset P₀ may be significant in practice. When a user'sdigit is charged with static, the initial offset P₀ may sometimes beaccompanied by an initial false peak (not shown) which is believed toresult from electrostatic discharge and/or capacitive coupling to theuser's charged digit. Including an initial false peak (not shown) mayresult in inaccurate force outputs, However, simply setting gradient andvalue thresholds to exclude initial offsets P₀ and/or false peaks (notshown) will cause reduced sensitivity throughout the remainder of theuser interaction.

Secondly, after an initial peak P₁ is reached, the pressure signal 30values P(t) may decay to an offset value P_(off) Which is not equal tozero. It has been observed that the offset value P_(off) is generallythe opposite sign to the initial peak P₁. It has also been observed thatthe offset value P_(off) may change after each user interaction with aparticular sensing electrode 5, 11, such that conventional DC offsetcorrection and calibration methods may be less effective or ineffective.Furthermore, the pressure signal 30 values P(t) may, during a fractionof user interactions, display a false peak P₂ during which the pressuresignal 30, P(t), overshoots the offset value P_(off) before settling.The magnitude of a false peak P₂ can be significant during some userinteractions.

As explained hereinbefore, simply setting gradient and value thresholdsto exclude initial offsets and/or electrostatic discharge peaks, offsetvalues P_(off) and false peaks P₂ may cause reduced sensitivitythroughout the remainder of the user interaction. However, simpleconditional integration schemes may have sufficient resolution for someapplications.

With reference to the examples plotted in FIGS. 5 and 6, the applicationof one example method of determining force values 23 based on apiezoelectric pressure signal 19, 22, 30 will be described.

As a user interaction progresses, the controller 15 updates a stateregister value between at least 4 distinguishable states, S₀, S₁, S₂ andS₄. The boundaries of and transitions between states S₀, S₁, S₂ and S₃are indicated in FIGS. 5 and 6 for reference. In FIG. 6, the outputforce values 23 are plotted against the secondary y-axis.

When the user interaction begins, which in the FIGS. 5 and 6 example isdetermined based on capacitance signals 20, the user interaction is,initialised into a first, or initial state S_(o). In this example,during the initial state S_(o), the pressure signal 30 values P(t) arenot used unless they have the appropriate sign for increasing load onthe touch panel 1. For the examples shown in FIGS. 5 and 6, theappropriate sign is negative, but in other examples the pressure signal30 values P(t) may increase in response to increasing applied force. Inpractice, this condition may be applied by generating processed pressuresignal 31 values P*(t), according to:

$\begin{matrix}{{P^{*}(t)} = \begin{Bmatrix}{P(t)} & {{if}\mspace{14mu}{{sign}\left\lbrack {P(t)} \right\rbrack}} \\0 & {otherwise}\end{Bmatrix}} & (1)\end{matrix}$

During the initial state S₀, output force values 23, F(t) are obtainedfor each new sampling of the pressure signal 30 value P(t) by adding thecorresponding processed signal 31 value P*(t) to the previous outputforce value 23, i.e. F(t)=F(t−δt)+P*(t), in which δt is a samplinginterval. Since the processed signal 31 value P*(t) is set to zero whenthe pressure signal 30 value P(t) has the wrong sign for increasingapplied force, such values do not contribute to the output force values23, F(t).

Note that the output force values 23, F(t) are proportional to appliedforce, but to obtain an estimated measurement of absolute applied force,the force values 23, F(t) will need to be multiplied by correspondingscale factors. The scale factors may be obtained from calibrationexperiments using known applied force profiles. Scale factors mayfurther depend on the location of a user interaction with the touchpanel 1.

The transition to a second, primary loading, state S₁ may occur once apredetermined duration has elapsed since the start of the userinteraction. The start of the user interaction can be determined knownwith good accuracy if capacitance signals 20 are obtained. During theprimary loading state S₁, all sample pressure signal 30 values P(t) maybe used unconditionally, i.e. the processed signal 31 may be set asP*(t)=P(t) and the output force value 23 F(t) may updated asF(t)=F(t−δt)+P*(t).

The transition to a third, or settling, state S₂ may occur when thepressure signal 30 values P(t) change sign, or after the controller 15has conclusively detected the initial loading peak P₁. In the exampleshown in FIGS. 5 and 6, the state transition S₁ to S₂ occurs because thepressure signal 30 values P(t) have changed sign from negative topositive. Of course, in other examples where increasing the appliedforce causes the pressure signal 30 to increase, the transition may bedetected in the opposite direction. The controller 15 may employ anysuitable numerical technique for determining the approximate time andvalue of initial peak P₁. During the settling state the pressure signal30 values P(t) may be not used, for example by setting the processedsignal values 31, P*(t) as P*(t)=o. Thus, in FIGS. 5 and 6, it may beobserved that in this example the processed signal 31 P*(t) clamps tozero during the false overshoot peak P₂.

The transition to a fourth, or stable state S₃ may occur once thepressure signal 30 values P(t) have stabilised at a DC offset P_(off).In general, the DC offset P_(off) may change slowly with time and/orfollowing each loading/unloading peak of the pressure signal 30 valuesP(t). In some examples the controller 15 maintains a buffer of a number,N_(buff) of previous pressure samples {P(t), P(t−δt), . . . ,P(t−δt(N_(buff)+1))}, in which context t, t−δt, t−δtN_(buff) aresampling times. When each new pressure sample P(t) is obtained, thefirst circuit 14 calculates a linear regression on the buffered samples{P(t), P(t−δt), . . . , P(t−δt(N_(buff)+1))}. Once the magnitude of theslope, m, and the variance value, VAR, of the buffered pressure signal30 samples {P(t), P(t−δt), . . . , P(t−δt(N_(buff)+1))} are belowpre-calibrated thresholds m_(stable), VAR_(stable), the controller 15updates the state register value to the stable state S₃ and sets themean value of the buffered samples {P(t), P(t−δt), . . . ,P(t−δt(N_(buff)+1))} as a offset correction value P_(cor)=mean({P(t),P(t−δt), . . . , P(t−δt(N_(buff)+1))}).

During the stable state S₃, the processed pressure signal 31 valuesP*(t) may be set according to P*(t)=P(t)−P_(cor). The output forcevalues 23, F(t) may then updated according to:

$\begin{matrix}{{F(t)} = \begin{Bmatrix}{{F\left( {t - {\delta\; t}} \right)} + {P^{*}(t)}} & {if} & {{{P^{*}(t)}} > P_{noise}} \\{F\left( {t - {\delta\; t}} \right)} & {if} & {{{P^{*}(t)}} \leq P_{noise}}\end{Bmatrix}} & (2)\end{matrix}$

In which P_(noise) is a noise threshold. For example, P_(noise) may beset to a multiple of the standard deviation of the pressure signal 19,22, 30 values P(t) during a calibration period in which there are nouser interactions. The noise threshold P_(noise) may be set to amultiple of five time the standard deviation of the pressure signal 19,22, 30 values P(t) recorded during a calibration period. The noisethreshold P_(noise) may be pre-set, or may be periodically updatedduring quiet periods during which there are no user interactionsdetected, for example using the capacitive signals 20.

Changes in user applied force may be captured during the stable state S₃with high sensitivity, whether they are increases or decreases inapplied force. In the example shown in FIGS. 5 and 6, the small peak P₃corresponding to a slight reduction in applied pressure is detected andthe output force values 23, F(t) are correspondingly decreased.

During the stable state S₃, the threshold for detecting a change in theforce applied to the touch panel 1 may be set to a lower value thanwould be possible for a conventional gradient and value basedconditional integration applied to an entire signal. This is becauseeffects such as static discharge/coupling, initial offset P₀, overshootoffset P_(off) and false peaks P₂ may be screened out through the use ofthe other state register values S₀, S₁ and S₂.

In practice, the required offset correction P_(cor) may slowly driftwhilst a user maintains a constant applied input force. Additionally, ifa user substantially increases or decreases the applied input force,this may change the offset P_(off) to which the piezoelectric pressuresignal 19, 22, 30 values P(t) decay. However the correction valueP_(cor) cannot simply be updated continuously whilst the buffer {P(t),P(t−δt), . . . , P(t−δt(N_(buff)+1))} remains relatively flat (i.e.m<m_(stable) and VAR<VAR_(stable)). If this was the case, any slightincrease or decrease of the applied input force would be continuouslyremoved from the processed pressure signal 31, P*(t), and wouldtherefore not be detected.

Instead, during the stable state S₃ the controller 15 may perform linearregression on the buffer {P(t), P(t−δt), . . . , P(t−δt(N_(buff)+1))}after each new sampling P(t). Whilst the buffer {P(t), P(t−δt), . . . ,P(t−δt(N_(buff)+1))}) remains flat (i.e. m<m_(stable) andVAR<VAR_(stable)), the mean value of the buffered samples is comparedagainst the correction value P_(cor) and, if the magnitude of thedifference |mean{P(t), P(t−δt), . . . , P(t−δt(N_(buff)+1))})−P_(cor)|,is less than a threshold value ΔP_(cor), then the correction valueP_(cor) is unchanged. However, if the difference, |mean({P(t), P(t−δt),. . . , P(t−δt(N_(buff)+1))})−P_(cor)|, exceeds a threshold valueΔP_(cor), then the correction value is updated to P_(cor)=mean({P(t),P(t−δt), . . . , P(t−δt(N_(buff)+1))}).

The value of the threshold ΔP_(cor) may vary for each touch panel 1 andapparatus 13. A suitable value for a given touch panel 1 and apparatus13 may be obtained by measuring data corresponding to a selection ofknown calibration force profiles. In a simple case, the thresholdΔP_(cor) may be set according the largest drift observed over theduration of a known, static applied force. Alternatively, themeasurements obtained using known calibration force profiles may be usedto generate a training set for a fitting, using the deviation of theknown and measured forces as a cost function.

The stable state S₃ ends at the end of the user interaction.

The preceding method of determining force values 23 is merely exemplaryand is not intended to unfit the claims appended to the presentspecification. The methods of the present specification may be appliedto piezoelectric. force values 23, F(t) regardless of the specificmethod or conditional integration scheme used to obtain the force values23, F(t).

First method: Referring also to FIG. 7, a first method of correctingforce values 23 for coupling to external electric fields shall beexplained.

Force values 23 are received from the touch panel 1, for example via thefirst circuit 14 and controller 15 (step S1). Each force value 23corresponds to a particular physical location on the touch panel 1. Forexample, a force value 23 corresponding to the n^(th) of N first sensingelectrodes 5 spaced apart in the y-direction may be denoted F(y_(n)) anda force value 23 corresponding to the m^(th) of M second sensingelectrodes 11 spaced apart in the x-direction may be denoted F(x_(m)).Each sensing electrode 5, 11 is an equipotential, and therefore firstsensing electrodes 5 elongated in the x-direction do not respond tovariations in the x-direction, and similarly for each second sensingelectrode 11. Each physical location x_(m), y_(n) may correspond to, forexample, a centroid of the respective first or second sensing electrode5, 11. In some examples, the first circuit 14 may aggregatepiezoelectric charges Q_(piezo) from two or more adjacent sensingelectrodes 5, 11 it to output a single first piezoelectric pressuresignal 19 for the grouped electrodes 5, 11. In such examples, eachphysical location x_(m), y_(n) may correspond to, for example, acentroid of the aggregated two or more first or second sensingelectrodes 5, 11.

Referring also to FIG. 8, a set of force values 23, F(x_(m)) isschematically illustrated, including both valid force values 23 a andexcluded force values 23 b.

Around the location of a user interaction, three of the force valuesF(x₉), F(x₁₀), F(x₁₁) are influenced by coupling to an external electricfield and consequently depart significantly from the underlying values32 which correspond to the physical strain in the layer of piezoelectricmaterial 7. Such external field couplings are believed to result from,amongst other sources, a user of the touch panel I becoming charged withstatic electricity.

An identification 24 of which, if any, of the force values 23, F(x_(m)),F(y_(n)) are influenced by coupling to external electric fields, is alsoreceived (step S2). Alternatively, the post-processing module 16 maymake the determination of which, if any, of the force values 23,F(x_(m)), F(y_(n)) are influenced by coupling to external electricfields. A range of suitable methods for detecting the presence, orlikely presence, of coupling to external electric fields are describedhereinafter.

If none of the force values 23, F(x_(m)), F(y_(n))are indicated to beinfluenced by coupling to external electric fields (step S3), then theforce values 23, F(x_(m)), F(y_(n))are output to the processor(s) (notshown) of a device (not shown) incorporating the apparatus 13 (step S4).The output force values 23, F(x_(m)), F(y_(n)) may be used as input toan operating system or software application which is being executed bythe processor(s) (not shown) of a device (not shown) incorporating theapparatus 13.

However, in response to one or more force values 23, F(x_(m)),F(y_(n))being identified as influenced by coupling to external electricfields (step S3), the corresponding force values 23, F(x_(m)), F(y_(n))are set as excluded force values 23 b, and the remaining force valuesare set as valid force values 23 a (step S5). For example, the forcevalues P(x_(k)), P(y_(p)) may be indicated as influenced by coupling toexternal electric fields, so that the valid force values 23 a areP(x_(m)), for all m≠k and P(y_(n)) for all n≠p. In general, zero, one,or more than one force values 23 a) may be excluded from the x or yforce values, In other words, if a total number Mex of the measurementsin the x-direction are excluded force values 23 b then the valid forcevalues 23 a may be P(x_(m)) for all m≠k, . . . , k_(Mex) and if a totalnumber Nex of the measurements in the y-direction are excluded forcevalues 23 b then the valid force values 23 a may be P(y_(n)) for alln≠p₁, . . . , p_(Nex). When two or more force values 23 b are excluded,they may or may not correspond to adjacent physical locations, forexample k₁, . . . , k_(Mex) need not be sequential.

In the example shown in FIG. 8, three force values F(x₉), F(y₁₀), F(x₁₁)are excluded force values 23 b, for Mex=3 and k₁9, k₂10, k₃=11. Theremaining force values F(x₁) to F(x₈ and F(x₁₂) to F(x₁₄)are the validforce values 23 a.

Reconstructed force values 25 are determined corresponding to the samephysical locations as any excluded force values 23b by interpolatingand/or extrapolating based on the valid force values 23 a and respectivephysical locations (step S6). For example., the valid force values 23 a,F(x_(m)) (m≠k₁, . . . , k_(Mex)) and P(y_(n)) (n≠p₁, . . . , p_(Nex))may be used to generate reconstructed values R(x_(k)), and R(y_(p))corresponding to the physical locations x_(k), y_(p) of the excludedforce values 23 b, F(x_(k)), F(y_(p)) (for k=k₁, . . . , k_(Mex) andp=p₁, . . . , p_(Nex)). The process is one of interpolation when areconstructed value R(x_(k)), R(y_(p)) is determined for a physicallocation x_(k), y_(p) which is spanned by a pair of valid force values23 a, and one of extrapolation when, for example, the excluded forcevalues 23 b, F(x_(k)), F(y_(p)) extend up to an edge of the touch panel1.

Referring also to FIG. 9, reconstructed farce values 25 are shown forthe example shown in FIG. 8.

Reconstructed force values R(x₀), R(x₁₀), R(x₁₁) have been interpolatedbased on the valid force values 23 a, F(x₁) to F(x₈) and F(x₁₂) toF(x₁₄) and the respective physical locations.

A variety of methods may be employed in order to determine thereconstructed force values 25. For example, polynomial interpolation maybe applied to the valid force values 23 a, and the respective physicallocations x_(m), y_(n) in order to interpolate and/or extrapolate one ormore reconstructed force values 25. Polynomial interpolation may beperformed using a Lagrange polynomial method, a Newton polynomialmethod, or any other suitable polynomial interpolation method.

In alternative examples, interpolating and/or extrapolating one or morereconstructed force values R(x_(k)), R(x_(p)) may be performed byfitting a force value model to the valid force values 23 a and therespective physical locations. For example, a force value model may befitted using a least squares fitting methodology. Force value models maybe based on any complete set of basis functions including, but notlimited to, polynomials, sine or cosine functions, and so forth.

In other alternative examples, one or more reconstructed force valuesR(x_(k)), R(y_(p)) may be interpolated and/or extrapolated bydetermining a spline interpolant connecting each of the valid forcevalues 23 a, F(x_(m)) (m≠k₁, . . . , k_(Mex)) and F(y_(n)) (n≠p₁, . . ., p_(Nex)) and the respective physical locations x_(m) (m≠k₁, . . . ,k_(Mex)), y_(n) (n≠p₁, . . . , p_(Nex)). A spline interpolant may bequadratic or cubic. A spline may use linear interpolation for locationsproximate to an edge of the touch panel, and higher order interpolationelsewhere. This may help to avoid unrealistic diverging values atlocations close to an edge of the touch panel 1.

The valid force values 23 a, F(x_(m)) (m≠k₁. . . . , k_(Mex)) andP(y_(n)) (n≠p₁, . . . , p_(Nex)) and the reconstructed pressure forcevalues 25, R(x_(k)), R(y_(p)) (for k=k₁. . . . , k_(Mex) and p=p₁, . . ., p_(Nex)) are output to the processor(s) (not shown) of a device (notshown) incorporating the apparatus 13 (step S7). The valid force values23 a, F(x_(m)) (m≠k₁, . . . , k_(Mex)) and P(y_(n)) (n≠p₁, . . . ,p_(Nex)) and the reconstructed force values 25, R(y_(p)), R(y_(p)) (fork=k₁, . . . , k_(Mex) , and p=p₁, . . . , p_(Mex)) may be used as inputsto an operating system or software application which is being executedby the processor(s) (not shown) of a device (not shown) incorporatingthe apparatus 13.

Whilst the apparatus 13 remains active (step S8), further force values23 are received (step S1).

Second method: Referring also to FIG. 10, a second method of correctingforce values 23 for coupling to external electric fields shall beexplained. The second method is an example of the first method which isspecific to polynomial interpolation methods.

Steps of the second method which are identical to the first method willnot be re-described (steps S1 to S5 and S7).

The post-processing module 16 determines a set of interpolationlocations x′_(m), y′_(n), each interpolation location y′_(m), y′_(n)corresponding to one of the original physical locations x_(m), y_(n)(step S6 a). In other words, the number of interpolation locationsx′_(m), y′_(n) is equal to the number of force values 23 received. Inother examples, the interpolation locations x′_(m), y′_(m), may bedetermined in advance and may be retrieved by the post-processing module16 when required. The interpolation locations x′_(m), y′_(n), aredistributed unevenly, with a higher spatial density towards the edges ofthe touch panel 1. By contrast, the physical locations x_(m), y_(n)corresponding to touch panel 1 electrodes 5, 11 are typically evenlyspaced.

The reason for having an increased spatial density of interpolationlocations x′_(m), y′_(n) towards the touch panel 1 edges is to try andavoid or minimise the occurrence of Runge's phenomenon, which refers toproblematic oscillations which may be observed at the boundaries whenpolynomial interpolation is applied to equi-spaced interpolation points.The distribution of the interpolation locations x′_(m), y′_(n) may bechosen so as to mitigate or avoid Runge's phenomenon.

For example, referring also to FIG. 11, the interpolation locationsx′_(m), y′_(n) may be calculated as Chebyshev points 33 (also sometimesreferred to as Chebyshev nodes), each corresponding to one of theoriginal equi-spaced physical locations 34.

The Chebyshev point 33 corresponding to the m^(th) of M physicallocations x_(m) spaced in the x-direction may be determined as:

$\begin{matrix}{x_{m}^{\prime} = {\frac{x_{\min} + x_{\max}}{2} + {\frac{x_{\max} - x_{\min}}{2}{\cos\left( \frac{m\;\pi}{M - 1} \right)}}}} & (3)\end{matrix}$

In which x_(min) is either x₁ or the start of the touch panel, x_(minx)is either x_(N) or the end of the touch panel and n=1, 2, . . . , N.Preferably, x_(min)=x₁ and x_(max)=x_(N). The Chebyshev point 33corresponding to the n^(th) of N physical locations y_(n) spaced in they-direction may be similarly determined.

Estimated force values F_(est)(x′_(m)), F_(est)(y′_(n)) are determinedcorresponding to some or all of the interpolation locations x′_(m),y′_(n)(step S6 b). The estimated force value F_(est)(x′_(m)),F_(est)(y′_(n)) for an interpolation location x′_(m), y′_(n) isdetermined based on interpolating or extrapolating valid force values 23a, F(x_(m)) (m ≠k₁, . . . , k_(Mex)) and F(y_(n)) (n≠p₁, . . . ,p_(Nex)) from two or more physical locations x_(m), y_(n) proximate toor spanning the interpolation location x′_(m), y′_(n).

Interpolation option A: In some implementations, an estimated forcevalue F_(est)(x′_(m)), F_(est)(y′_(n)) may be determined for everyinterpolation location x′_(m), y′_(n). Such examples may beover-constrained when the polynomial interpolant is subsequentlycalculated, and tend to be stable. However, over-constraining theinterpolant may result in underestimating the reconstructed force values25.

Interpolation option B: In other implementations, an estimated forcevalue F_(est)(x′_(m)), F_(est)(y′_(n)) may only be determined for eachinterpolation location x′_(m), y′_(n) which corresponds to a valid forcevalue 23 a, F(x_(m)) m≠k₁, . . . , k_(Mex)) and F(y_(n)) (n≠p₁, . . . ,p_(Nex)). An interpolation location x′_(m), y′_(n) corresponds to aforce value 23, F(x_(m)), F(y_(n)) if the position of the interpolationlocation x′_(m), F(y_(n)) within a sequence of all the interpolationlocations)e_(m), _(y)′₃, ordered by coordinate matches the position ofthe physical location x,, y, associated with the force value 23,F(x_(n),), F(y) within a sequence of all the physical locations x_(m),y_(n) ordered by coordinate (see also Equation (3)). For example,referring again to FIGS. 8 and 9, estimated force valuesF_(est)(x′_(m)), F_(est)(y′_(n)) would not be calculated for the 9^(th),10^(th) and 11^(th) interpolation locations x′₉, x′₁₀, x′₁₁.Interpolation option B may provide a better estimate of thereconstructed force values 25 because the calculation of theinterpolating polynomial is less constrained through the region in whichforce values 23 b have been excluded. However, when the excluded forcevalues 23 b are located close to an edge of the touch panel 1, this lessconstrained approach ma be less accurate than the previously explainedover-constrained interpolation option A.

Hybrid interpolation option: In a refinement of the method, a selectionbetween (option A) determining estimated force values F_(est)(x′_(m)),F_(est)(y′_(n)) for every interpolation location x_(m), y′_(m), or(option B) determining estimated force values F_(est)(x′_(m)),F_(est)(y′_(n)) only for those interpolation locations x′_(m), y′_(n),which correspond to a valid force value F(x_(m)) (m≠k₁, . . . , k_(Mex))and F(y_(n)) (n≠p₁, . . . , p_(Nex)), may be made according to thephysical locations x_(m), y_(n) corresponding to the excluded forcevalues 23 b. In this hybrid approach, when the excluded force values 23b are close to an edge of the touch panel the over-constrained (optionA) may be used for stability. By contrast, when the excluded forcevalues 23 b are not close to an edge of the touch panel 1, the lessconstrained (option B) may be used to obtain less constrained estimatesfor the reconstructed force values 25.

It has been found that force values 23 affected by coupling to externalelectric fields are typically those which correspond to the physicallocations x_(m), y_(n) which are closest to a user interaction.Consequently, in some implementations, the post-processing module 16 mayalso receive touch location data 27 (or “touch coordinates”)corresponding to one more user interactions. The selection betweenwhether to use interpolation option A or interpolation option B may bebased on the received touch coordinates. Touch location data 27 may bedetermined based on the first pressure signals Alternatively, whencapacitive Sensing is implemented, touch location data 27 may bedetermined using the capacitance signals 20.

Interpolation option C: In some implementations, the number ofinterpolation locations x′ _(m), y′_(n) used may be intermediate betweenoptions A and B. For example, an estimated force value F_(est)(x′_(m)),F_(est)(y′_(n)) may be determined for each interpolation locationy′_(m), y′_(n) which is spanned by a pair of adjacent physical locationsx_(m), y_(n) which both correspond to valid force values 23 a, F(x_(m))(m≠k₁, . . . , k_(Mex)), F(y_(n)) (n≠p₁, . . . , p_(Nex). Additionally,estimated force values F_(est)(x′_(m)), F_(est)(y′_(n)) may also bedetermined for each interpolation location x′_(m), y′_(n) which iswithin a predetermined distance of a physical location x_(m), y_(n)corresponding to a valid force value 23 a, F(x_(m)) (m≠k₁, . . . ,k_(Mex)), F(y_(n)) (n≠p₁, . . . , p_(Nex)).

First method of determining estimate force values: The estimated forcevalues F_(est)(x′_(m)), F_(est)(y′_(n)) may be determined in a number ofdifferent ways,

According to a first method of estimating force values F_(est)(x′_(m)),F_(est)(y′_(n)), each estimated force value F_(est)(x′_(m)),F_(est)(y′_(n)) is calculated according to linear interpolation using apair formed from the valid force values immediately preceding andfollowing the interpolation location X′_(m), y′_(n), itself.

Referring also to FIG. 12, a first location 35, K₄ corresponds to validforce value 23 a, f(x₄), a second location 36, x₂ corresponds to validforce value 23 a, F(x₂), and a third location 37, x₅ corresponds tovalid force value 23 a, F(x₅). The force value F(x₃) is an excludedforce value 23 b because it was indicated as influenced by (or likelyinfluenced by) coupling to external electric fields. An interpolationlocation x′₄ corresponding to the first location 35, x₄ is shownincluding possible values obtained by interpolation between F(x₂) andF(x₄) or extrapolation from F(x₄) and F(x₅). Additional interpolationlocations x′₃, x′₅ are also indicated.

Applying the first method of estimating force values F_(est)(x′_(m)),F_(est)(y′_(n)) to the fourth interpolation location x′₄, the pair ofvalid force values 23 a immediately preceding and following theinterpolation location x′₄ consists of F(x₂) at the second location 36,x₂ and F(x₄) at the first location 35, x₄. The estimated force valueF_(est)(x′₄) may be interpolated as:

$\begin{matrix}{{F_{est}\left( x_{4}^{\prime} \right)} = {F_{24} = {{F\left( x_{2} \right)} + {\left( {{F\left( x_{4} \right)} - {F\left( x_{2} \right)}} \right)\frac{x_{4}^{\prime} - x_{2}}{x_{4} - x_{2}}}}}} & (4)\end{matrix}$

The physical location x₃ and the corresponding force value F(x₃) are notused as the immediately preceding interpolation location, because thesecorrespond to an excluded force value 23 b.

Similarly, for the third interpolation location x′₃, the pair of validforce values 23 a immediately preceding and following the interpolationlocation x′₃ again consists of F(x₂) at the second location 36, x₂ andF(x₄ ) at the first location 35, x₄. The estimated force valueF_(est)(x′₃) may be interpolated as:

$\begin{matrix}{{F_{est}\left( x_{3}^{\prime} \right)} = {{F\left( x_{2} \right)} + {\left( {{F\left( x_{4} \right)} - {F\left( x_{2} \right)}} \right)\frac{x_{3}^{\prime} - x_{2}}{x_{4} - x_{2}}}}} & (5)\end{matrix}$

For the fifth interpolation location x′₅, the pair of valid force values23 a immediately preceding and following the interpolation location x′₅consists of F(x₄) at the first location 35, x₄ and F(x₅) at the thirdlocation 37, x₅. The estimated force value F_(est)(x′₅) may beinterpolated as:

$\begin{matrix}{{F_{est}\left( x_{5}^{\prime} \right)} = {{F\left( x_{4} \right)} + {\left( {{F\left( x_{4} \right)} - {F\left( x_{4} \right)}} \right)\frac{x_{5}^{\prime} - x_{4}}{x_{5} - x_{4}}}}} & (6)\end{matrix}$

When a particular interpolation location x′_(m), y′_(n) is not spannedby at least a pair of valid pressure values 23 a, for example when anexcluded pressure value 23 b) occurs close to an edge of the touch panel1, then linear extrapolation based on the two closest valid pressurevalues 23 a may be used instead of linear interpolation.

The first method of determining estimated force values may be applied tointerpolation locations selected according to any one of interpolationoptions A to C or the hybrid interpolation option.

Second method of determining estimated force values: According to asecond method of determining estimated force values F_(est)(x′_(m)),F_(est)(y′_(n)), each estimated force value F_(est)(x′_(m)),F_(est)(y′_(n)) may be determined by reference to estimation pair (1), apair of a first valid force value 23 a, and a second valid force value23 a which is the closest valid force value 23 a preceding (with respectto a given coordinate system) the first valid force value 23 a, and therespective physical locations x_(m), y_(n); or, estimation pair (2), apair of the first valid force value 23 a, and a third valid force value23 a which is the closest valid force value 23 a following (with respectto the given coordinate system) the first valid force value 23 a, therespective physical locations x_(m), y_(n).

The first valid force value 23 a is always the valid force value 23which corresponds to the interpolation location x′_(m), y′_(n), or if aninterpolation location x′_(m), y′_(n), has no corresponding the validforce value 23 a, the closest valid force value 23 a. As defined inrelation to interpolation option B, a valid force value 23 a correspondsto an interpolation location x′_(m), y′_(n) if the position of therespective physical location x′_(m), y′_(n) within a sequence of all thephysical locations x_(m), y_(n) ordered by coordinate matches theposition of the interpolation location x′_(m), y′_(n) within a sequenceof all the interpolation locations x′_(m), y′_(n) ordered by coordinate.

For example, referring again to FIG. 12 and considering the fourthinterpolation location x′₄, the first valid pressure value 23 a is F(x₄)at the first location 35, x₄. In this case, the first valid pressurevalue 23 a, F(x₄) corresponds to interpolation location x′₄. The closestvalid force value 23 a preceding the first valid force value F(x₄) isF(x₂) at the second location ₃6, x_(a), so that estimation pair (i)consists of first valid force value F(x₄), x₄ and second valid forcevalue F(x₂), x₂. The force value F(x₃) at physical location x₃ is anexcluded force value 23 b and is not used. The closest valid force value23 a following the first valid force value F(x₄) is F(x₅) at the thirdlocation 37, x₅, so that the estimation pair (2) consists of first validforce value F(x₄), x₄ and third valid force value F(x₅), x₅.

Using the estimation pairs (1) and (2), the estimated pressure valueF(_(est)(x′₄) may be calculated according to:

$\begin{matrix}{{F_{est}\left( x_{4}^{\prime} \right)} = {{F\left( x_{2} \right)} + {\left( {{F\left( x_{4} \right)} - {F\left( x_{2} \right)}} \right)\left( \frac{x_{4}^{\prime} - x_{2}}{x_{4} - x_{2}} \right)}}} & \left( {7a} \right)\end{matrix}$or:

$\begin{matrix}{{F_{est}\left( x_{4}^{\prime} \right)} = {{F\left( x_{4} \right)} + {\left( {{F\left( x_{5} \right)} - {F\left( x_{4} \right)}} \right)\left( \frac{x_{4}^{\prime} - x_{4}}{x_{5} - x_{4}} \right)}}} & \left( {7b} \right)\end{matrix}$

Evidently, the value of F_(est)(x′₄) will depend on whether Equation(7a) or Equation (7b) is used for the calculation. For example, as shownin FIG. 12, if estimation pair (1) is used according to Equation (7a),then F_(est)(x′₄) will be interpolated as F₂₄, whereas if estimationpair (2) is used according to Equation (7b), then F_(est)(x′₄) will beextrapolated as F₄₅≠F₂₄.

The selection between estimation pairs (1) or (2) (e.g. betweenEquations (7a ) and (7b)) may be made in dependence upon a cost functioncalculated for the first estimation pair (1) and the second estimationpair (2). Examples of suitable cost functions include:

$\begin{matrix}{{C_{1} = {\sqrt{\left( {F_{b} - F_{a}} \right)^{2} + \left( {x_{b} - x_{a}} \right)^{2}} + C_{std}}}{C_{2} = {{{x_{b} - x_{int}}} \times \left( {1 + \frac{{x_{a} - x_{int}}}{{x_{b} - x_{a}}}} \right)}}{C_{3} = {{{x_{a} - x_{int}}} \times \left( {{\frac{F_{b} - F_{a}}{x_{b} - x_{a}}} + {{x_{b} - x_{a}}}} \right)}}{C_{4} = {{{x_{a} - x_{int}}} \times \left( {{\frac{F_{b} - F_{a}}{x_{b} - x_{a}}} + {{x_{b} - x_{a}}} + {\max\left\{ {{{x_{b} - x_{int}}},1} \right\}}} \right)}}{C_{5} = {{{F_{b} - F_{a}}} \times {{x_{a} - x_{int}}}}}{C_{6} = {{\left( {{{x_{a} - x_{int}}} + {{x_{b} - x_{a}}}} \right) \times {\frac{F_{b} - F_{a}}{x_{b} - x_{a}}}} + C_{std}}}{C_{7} = {{{x_{a} - x_{int}}} \times C_{std} \times {\frac{F_{b} - F_{a}}{x_{b} - x_{a}}}}}{C_{8} = {{{{x_{a} - x_{int}}} \times {\frac{F_{b} - F_{a}}{x_{b} - x_{a}}}} + C_{std}}}{C_{9} = {{F_{b} - F_{a}}}}{C_{10} = {{{x_{b} - x_{int}}} \times \max\left\{ {\frac{{x_{a} - x_{int}}}{{x_{b} - x_{a}}},\frac{{x_{b} - x_{int}}}{{x_{b} - x_{a}}},1} \right\}}}} & (8)\end{matrix}$

In which C₁ to C₁₀ are first to tenth cost functions, F_(a)=F(x_(a)) andF_(b)=F(x_(b)) are valid force values corresponding to respectivephysical locations x_(a), x_(b), x_(int) is the interpolation location,and C_(std) is a standard cost calculated according to:C _(std)=max{|x _(b) −x _(int)|,1}  (9)

A chosen cost function C₁, . . . , C₁₀ may be evaluated firstly usingthe first estimation pair (1) to provide the arguments F_(a), x_(a),F_(b), x_(b), and secondly using the second estimation pair (2) toprovide the arguments F_(a), x_(a), F_(b), x_(b). The estimation pair(1), (2) which has the lowest value of the chosen cost function C₁, . .. , C₁₀ is then used to interpolate or extrapolate the estimated forcevalue F_(est)(X_(int)) corresponding to the interpolation locationX_(int). The hereinbefore listed cost functions C₁, . . . , C₁₀ do notrepresent an exhaustive list, and other cost functions may be usedinstead of C₁, . . . , C₁₀.

Returning to the example of the fourth interpolation point x′₄ shown inFIG. 12, if the first estimation pair (1) consisting of second validforce value F(x₂, x₂ and first valid force value F(x₄), x₄ has the lowervalue of the cost function C₁, . . . C₁₀ then the estimated force valueF_(est)(x′₄) will be calculated as F₂₄ according to Equation (7a).However, if the second estimation pair (2) consisting of first validforce value F(x₄), x₄ and third valid force value F(x₅), x₅, has thelower value of the cost function C₁, . . . , C₁₀, then the estimatedforce value F_(est)(x′₄) will be calculated as F₄₅ using Equation (7b).

Applying the second method of determining estimated force values to thefifth interpolation location x′₅, the first valid force value 23 isF(x₅) at physical location x₅, which corresponds to the fifthinterpolation location x′₅. Estimation pair (1) consists of first validforce value F(x₅), x₅ and second valid force value F(x₄), x₄(corresponding to interpolation of F_(est)(x′₅) at x′₅). Estimation pair(2) consists of first valid force value F(x₅), x₅ and third valid forcevalue F(x₆), x₆ (corresponding to extrapolation of F_(est)(x′₅) at x′₅).

The application of the second method of determining estimated forcevalues to the third interpolation location x′₃ is slightly differentbecause the third interpolation location x′₃ has no directlycorresponding valid pressure value 23 a. Instead, the first valid forcevalue 23 a is selected as the closest to the third interpolationlocation x′₃, which is F(x₂) at x₂. Then, the first estimation pair (1)consists of first valid force value F(x₂), x₂ and second valid forcevalue F(x₁), x₁ (not shown in FIG. 12). In this case, the firstestimation pair (1) corresponds to extrapolation of Fest(x′₃), x′₃. Thesecond estimation pair (2) consists of first valid force value F(x₂), x₂and third valid force value F(x₄), x₄. In this case, the secondestimation pair (1) corresponds to interpolation of Fest(x′₃), x′₃.

Whether the second method of determining estimated force valuescorresponds to interpolation or extrapolation depends upon the values ofthe cost functions, and the relative locations of the interpolationlocations x′_(m), y′_(n), the valid pressure values 23 a and theexcluded pressure values 23 b.

Third method of determining estimated force values: A third method issimilar to the second method, except that third and fourth estimationpairs (3), (4) are selected according to slightly different criteriafrom the first and second estimation pairs (1), (2) of the secondmethod.

For each interpolation location x′_(m), y′_(n), a first valid forcevalue 23 a is identified in the same way as for the second method.However, unlike the second method in which the first valid force valuewas part of the first and second estimation pairs (1), (2), the thirdand fourth estimation pairs (3), (4) do not include the first validforce value 23 a.

Using the third method of determining estimated force valuesF_(est)(x′_(m)), F_(est)(y′_(n)), each estimated force valueF_(est)(x′_(m)), F_(est)(y′_(n)) may be determined by reference to:

estimation pair (3) which consists of the two valid pressure values 23 awhich are closest to the first valid pressure value 23 a in anydirection; or

estimation pair (4) which consists of the closest valid pressure value23 a to the first valid pressure value in the positive coordinatedirection and the closest valid pressure value 23 a to the first validpressure value 23 a in the negative coordinate direction.

The cost functions C₁, . . . , C₁₀ are calculated for the third andfourth estimation pairs (3), (4), and the pair (3), (4) having thelowest value of the cost function C₁, . . . , C₁₀ is used to interpolateor extrapolate the estimated force value F_(est)(x′_(m)),F_(est)(y′_(n)).

Referring again to the example shown in FIG. 12 in relation to thefourth interpolation location x′₄. The first valid pressure value 23 acorresponding to the fourth interpolation location x′₄ is F(x₄) atphysical location x₄. The third estimation pair (3) includes F(x₅) atx₅, however, F(x₆) at x₆ and F(x₂) at x₂ are equally close. Suchambiguities in selecting the third estimation pair (3) may be resolvedin a variety of ways. For example, minimum spacing between the validforce values may be prioritised, in which case the third estimation pair(3) might consist of F(x₅) at x₅, and F(x₆) at x(₆. Alternatively, thedistance to the interpolation point x′₄ may be used to resolve theambiguity, in which case the third estimation pair (3) would consist ofF(x₅) at x₅ and F(x₂) at x₂. Alternatively, when there are ambiguities,a chosen cost function C₁, . . . C₁₀ may be calculated for all possiblepairings. In general, any suitable strategy may be used to resolveambiguities in selection of the third estimation pair (3).

The fourth estimation pair (4) does not experience the same issue withambiguity, and consists of F(x₅) at x₅ and F(x₂) at x₂. It may beobserved that the third and fourth estimation pairs (3), (4) may beidentical in some circumstances,

The same procedures may be followed in order to obtain estimated forcevalues F_(est)(x′_(m)), F_(est)(y′_(n)) in the x- and y-directions. Thecost functions C₁ to C₁₀ are merely examples, and any suitable costfunction may be used to determine which pair of physical locations 35,36, 37 to use for determining estimated force values F_(est)(x′_(m)),F_(est)(y′_(n)).

However, in other implementations, the estimated force valuesF_(est)(x′_(m)), F_(est)(y′_(n)) may be calculated in other ways. Forexample, quadratic or cubic splines may be calculated which connect allof the valid force values 23 a, F(x_(m)) (m≠k₁, . . . , k_(Mex)). Theestimated force values F_(est)(x′_(m)) may then be calculated for someor all of the interpolation locations x′_(m) using the correspondingspline segment. Estimated force values F_(est)(y′_(n)) may then becalculated for some or all of the interpolation locations y′_(m), y′_(n)in the same way.

Once the interpolation locations y′_(m), y′_(n) and correspondingestimated force values F_(est)(x′_(m)), F_(est)(y′_(n)) have beendetermined, these are used as inputs to generate an interpolatingpolynomial (step S6 c). As explained hereinbefore, any suitablepolynomial interpolation method may be used. One suitable example isLagrange interpolation.

Calculation of Lagrange polynomial for interpolation option A: Valuesfor every interpolation location x′_(m), y′_(n) and the correspondingestimated force values F_(est)(x′_(m)), F_(est)(y′_(n)) are used. Thus,there, are a total of M interpolation points in the x-direction and theLagrange interpolation polynomial is given by:L _(x)(x)=Σ_(m=1) ^(M) F _(est)(x′ _(m))×l_(m)(x)   (10)

in which m=1, . . . , M, and l_(m) (x) is a Lagrange basis polynomialgiven by:

$\begin{matrix}{{l_{m}(x)} = {\prod\limits_{j \neq m}\frac{x - x_{j}}{x_{m} - x_{j}}}} & (11)\end{matrix}$

in which j=1, . . . , M.

Similarly, there are a total of N interpolation points in they-direction and the Lagrange interpolation polynomial is given by:L _(y)(y)=Σ_(n=1) ^(N) F _(est)(y′ _(n))×l _(n)(y)   (12)in which m=1, . . . , M, and l_(n)(y) is a Lagrange basis polynomialgiven by:

$\begin{matrix}{{l_{n}(y)} = {\prod\limits_{j \neq n}\frac{y - y_{j}}{y_{n} - y_{j}}}} & (13)\end{matrix}$

Calculation of Lagrange polynomial for interpolation option B: Asdescribed hereinbefore, only interpolation locations x′m, y′ncorresponding to Valid force values are used. Thus, there are a total ofM−Mex interpolation points in the x-direction and the Lagrangeinterpolation polynomial is calculated using this smaller number ofinterpolation points. Similarly, there are a total of N−Nexinterpolation paints in the y-direction using interpolation option B.

Calculation of reconstructed force values: Once the Lagrangeinterpolation polynomials Lx(x), Ly(y) have been determined, these maybe used to calculate reconstructed force values 25 by substituting thephysical locations xm, yn corresponding to the excluded force values 23b into the Lagrange interpolation polynomials Lx(x), Ly(y) (step S6 d).For example, R(xk)=Lx(xk) for k=k1, . . . , kMex, and R(yp)=Ly(yp) forp=p1, . . . , pNex.

Experimental data: Referring also to FIG. 13, a comparison of originalforce values 23 and reconstructed force values 25 is shown.

The original force values 23 are labelled “F” and drawn with a dashedline and diamond markers. There was one excluded force value 23 b. Thevalid force values 23 a and a reconstructed force value 25 calculatedaccording to interpolation option A using the second method ofdetermining estimated force values and a Lagrange polynomial interpolantare labelled “A” and drawn with a solid line and square markers. Theoriginal force values 23 appear to show an unrealistically sharp peak inconsequence of coupling to external electric fields. When the affectedforce value 23 b is excluded and replaced using the reconstructed forcevalue 25, the peak value is decreased significantly by an amount ΔF_(A).In this way, a more physically realistic and accurate estimate of thepeak for value applied by a user interaction may be determined.

Referring also to FIG. 14h , the original force values 23 shown in FIG.13 are compared against a reconstructed force value 25 obtainedaccording to interpolation option B, using the second method ofdetermining estimated force values.

The original force values 23 are labelled “F” and drawn with a dashedline and diamond markers. The valid force values 23 a and areconstructed force value 25 calculated according to interpolationoption B, using the second method of determining estimated force values,and a Lagrange polynomial interpolant are labelled “B2” and drawn with asolid line and square markers.

Similarly to interpolation option A, a more physically realistic andaccurate estimate of the peak force value applied by a user interactionmay be determined using interpolation option B and the second method ofdetermining estimated force values F_(est)(x′_(m)), F_(est)(y′_(n)).

Referring also to FIG. 15, the original force values 23 shown in FIG. 13are compared against a reconstructed force value 25 obtained accordingto interpolation option B, using the third method of determiningestimated force values.

The original force values 23 are labelled “F” and drawn with a dashedline and diamond markers, The valid force values 23 a and areconstructed force value 25 calculated according to interpolationoption B, using the third method of determining estimated force values,and a Lagrange polynomial interpolant are labelled “B3” and drawn with asolid line and square markers, Similarly to interpolation option A, amore physically realistic and accurate estimate of the peak force valueapplied by a user interaction may be determined using interpolationoption B and the third method of determining estimated force valuesF_(est)(x′_(m)), F_(est)(y′_(n)).

Referring also to FIG. 16, the original force values 23 shown in FIG. 13are compared against a reconstructed force value 25 obtained using acubic spline.

The original force values 23 are labelled “F” and drawn with a dashedline and diamond markers. The valid force values 23 a and areconstructed force value 25 calculated using a cubic spline interpolantare labelled “Sp” and drawn with a solid line and square markers. Unlikethe reconstructed force values 25 shown in FIGS. 13 to 15, thereconstructed force value 25 shown in FIG. 16 has not been obtainedusing polynomial interpolation. Instead, cubic splines connecting thevalid force values 23 a were obtained, and the spline segment spanning aphysical location corresponding to the excluded force value 23 b wassampled at that physical location to obtain a reconstructed force value25. Similarly to the polynomial interpolation using interpolationoptions A, or B, a more physically realistic and accurate estimate ofthe peak force value applied by a user interaction may be determinedusing a cubic spline interpolant.

Referring also to FIG. 17, a comparison of the reconstructed forcevalues 25 shown in FIGS. 13 to 16 is shown. The axes of FIG. 17correspond to smaller ranges of force value and position, in order topermit more detailed comparison of the reconstructed force values 25.

Referring also to FIG. 18, a comparison is shown of reconstructed forcevalues 25 obtained using Lagrange polynomial interpolation according tointerpolation option A, interpolation option B using either the secondmethod (B2) of determining estimated force values F_(est)(x′_(m)),F_(est)(y′_(n)) or the third method (B3) of determining estimated forcevalues F_(est)(x′_(m)), F_(est)(y′_(n)), and also interpolation using acubic spline. The data shown in FIG. 18 corresponds to a different userinteraction than the data shown in FIG. 17, but was prepared usingidentical methods.

It may be observed that the variations amongst the different methods forobtaining reconstructed force value 25 are substantially smaller thanthe differences ΔF_(A), ΔF_(B2), ΔF_(B3) and ΔF_(Sp) between thereconstructed force values 25 and the original excluded force value 23 bwhich includes the influence of coupling to external electric fields. Inparticular, because the coupling to external electric fields may belarger than the actual pressure signal and depends on, for example, anamount of static charge, affected values can appear substantiallyuncorrelated to the amount of force a user is applying.

By contrast, although estimated, the reconstructed force values 25 offera more realistic measure of the applied force. Importantly, throughinterpolating and/or extrapolating the valid force values 23 a, thereconstructed force values 25 may be expected to be strongly correlatedto how much force a user is actually applying.

Referring also to FIG. 19, an example of a received first pressuresignal 19, P(t) and the corresponding force values 23, F(t) are shown asa function of time for a user interaction which was not influenced bycoupling to external electrostatic fields.

The force values 23, F(t) are plotted as a dashed line labelled “F”against the primary vertical axis and the pressure signal 19, P(t) isplotted as a solid line labelled. “P” against the secondary axis. It maybe observed that a user has applied and held a relatively constantapplied force, then released the force. Both the force values 23, F(t)and the pressure signal 19, P(t) exhibit expected behaviours.

Referring also to FIG. 20, an example of a received first pressuresignal 19, P(t) and the corresponding force values 23, F(t) are shown asa function of time for a user interaction which was influenced bycoupling to external electrostatic fields.

The data shown in FIG. 20 were obtained by a user scuffing theirfootwear on a synthetic fibre carpet, before tapping a touch panel 1.Data are shown for the sensing electrode 5, 11 closest to the locationwhich the user tapped. Reconstructed force values 25 are also shown,plotted as a chained line labelled “A”. The reconstructed force values25 were obtained using Lagrange polynomial interpolation usinginterpolation option A. In the data plotted in FIG. 20, the force values23 were excluded force values 23 b, and the reconstructed force values25 were obtained using valid force values 23 a from adjacent electrodes5, 11. It may be observed that if the raw output force values 23 wererelied upon, the applied pressure would be significantly overestimated.As a consequence of the output force values 23 being potentiallydominated by the coupling to static charge on the user, the measurementof applied force ma become substantially uncorrelated to the amount offorce which a user is applying. By contrast, the reconstructed forcevalues 25, being based on the adjacent valid force values 23 a, whichmay be only weakly coupled to, for example a static charge on the user'sdigit, may remain strongly correlated to the force which the user isactually applying.

Referring also to FIG. 21, a comparison is shown between thereconstructed force values 25 plotted in FIG. 20 and three alternativemethods of obtaining the reconstructed force values 25.

The reconstructed force values 25 calculated according to interpolationoption A using a Lagrange polynomial interpolant are labelled “A” anddrawn with a solid line. The reconstructed force values 25 calculatedaccording to interpolation option B using the second method ofdetermining estimated force values F_(est)(x′_(m)), F_(est)(y′_(n)) anda Lagrange polynomial interpolant are labelled “B2” and drawn with adashed line. The reconstructed force values 25 calculated according tointerpolation option B using the third method of determining estimatedforce values F_(est)(x′_(m)), F_(est)(y′_(n)) and a Lagrange polynomialinterpolant are labelled “B3” and drawn with a chained line. Thereconstructed force values 25 calculated using a cubic splineinterpolant are labelled “Sp” and drawn with a dotted line. It may beobserved, with reference again to FIG. 20, that the deviations amongstthe alternative methods of estimating the reconstructed force values 25are substantially less than the differences between any one set ofreconstructed values 25 and the original force values 23, 23 b includingthe influence of coupling to external electric fields. More importantly,because the reconstructed values 25 are estimated without using theexcluded force values 23 b, the reconstructed force values 25 retain acorrelation to the force which a user is actually applying to the touchpanel 1.

Referring also to FIG. 22, original force values 23, 23 b affected bycoupling to external electric fields are plotted against time forcomparison against reconstructed force values 25 obtained used a varietyof methods. The data plotted in FIG. 22 correspond to a different userinteraction to the data plotted in FIGS. 20 and 21.

The original force values 23 are labelled “F” and plotted using crossmarkers without a line. In the data plotted in FIG. 22, the force values23 were excluded force values 23 b, and the reconstructed force values25 were obtained using valid force values 23 a from adjacent electrodes5, 11. The reconstructed force values 25 calculated according tointerpolation option A using a Lagrange polynomial interpolant arelabelled “A” and drawn with a solid line. The reconstructed force values25 calculated according to interpolation option B using the secondmethod of determining estimated force values F_(est)(x′_(m)),F_(est)(y′_(n)) and a Lagrange polynomial interpolant are labelled “B2”and drawn with a dashed line, The reconstructed force values 25calculated according to interpolation option B using the third method ofdetermining estimated force values F_(est)(x′_(m)), F_(est)(y′_(n)) anda Lagrange polynomial interpolant are labelled “B3” and drawn with achained line. The reconstructed force values 25 calculated using a cubicspline interpolant are labelled “Sp” and drawn with a dotted line.Similar to FIG. 21, it may be observed that the deviations amongst thealternative methods of estimating the reconstructed force values 25 aresubstantially less than the differences between any set of reconstructedvalues 25 and the original force values 23 including the influence ofcoupling to external electric fields.

Determining which force values are influenced by external electricfields: In the first and second methods, an identification 24 isreceived (step S2) of which force values 23 are influenced, or likely tobe influenced, by coupling to external electric fields.

In some implementations of the first and second methods, the step ofreceiving the identification 24 may be replaced with a step ofdetermining which, if any, of the force values 23 are influenced, orlikely to be influenced, by coupling to external electric fields. Thisfunctionality may be implemented in the first circuit 14, the controller15, the post-processing module 16, or spread amongst all three. Aspreviously noted, these components may all be implemented using a singledevice in the form of a microcontroller, processor, and so forth, or therelevant functionality may be spread between two or more connectedcomponents.

Determining which, if any, of the force values 23 are influenced, orlikely to be influenced, by coupling to external electric fields, may beimplemented in a number of different ways:

For example, determining which, if any, of the force values 23 areinfluenced by coupling to external electric fields may include, for eachforce value 23 flagging the force value 23 as influenced by coupling toexternal electric fields if the force value 23 exceeds a pre-determinedvalue threshold. Referring again to FIGS. 13 to 16, it may be observedthat the original force values 23 which were identified as excludedforce values 23 b were significantly larger than the adjacent validforce values 23 a. Using pre-calibration with known forces, the range ofsignals expected to correspond to realistic user interactions may bedetermined, and the pre-determined value threshold may correspond tovalues exceeding a maximum calibrated input force (or multiple thereof).

Additionally or alternatively, determining Which, if any, of the forcevalues 23 are influenced by coupling to external electric fields mayinclude calculating one or more spatial gradients

$\frac{\partial F}{dx},\frac{\partial F}{dy}$corresponding to each force value 23 based on the plurality of forcevalues 23, F(x_(m)), F(y_(n)) and the respective physical locationsx_(m), y_(n). Any suitable numerical gradient may be used, includingforward, backward and symmetric differences such as:

$\begin{matrix}{\frac{\partial F}{\partial x} \approx \frac{{F\left( x_{m + 1} \right)} - {F\left( x_{m - 1} \right)}}{x_{m + 1} - x_{m - 1}}} & (14)\end{matrix}$

and similar approximate gradients in the y-direction. Note that at thestage of determining spatial gradients, none of the force values 23 havebeen excluded yet, and so discontinuities due to omitted values are notproblematic. Where symmetric difference gradients are calculated, thesewill need to be. substituted with forward- or backward-differencegradients near edges of the touch panel 1.

For each force value 23, F(x_(m)), F(y_(n)), if the correspondingspatial gradient(s)

$\frac{\partial F}{dx},\frac{\partial F}{dy}$exceed a pre-determined spatial gradient threshold, that force value 23,F(x_(m)), F(y_(n)) may be flagged as influenced by coupling to externalelectric fields. Similar to the value threshold, the spatial gradientthreshold may be pre-calibrated to correspond to, or exceed, a maximumspatial gradient measured using known calibration loads. In this way,spatial gradients which exceed the spatial gradient threshold may beinterpreted as corresponding to unphysical local curvatures, whichconsequently are probably due to external interference with the measuredforce values 23.

Additionally or alternatively, determining which, if any, of the forcevalues 23 are influenced by coupling to external electric fields mayinclude calculating a temporal gradient

$\frac{\partial F}{\partial t}$corresponding to each force value 23, based on a currently measuredforce value F(t) and a buffer storing previously measured force valuesF(t−δt), F(t−2δt) and so forth, with δt being the sampling interval. Foreach force value, if the corresponding temporal gradient

$\frac{\partial F}{\partial t}$exceeds a pre-determined temporal gradient threshold, that force value23, F(t) may be indicated as influenced by coupling to external electricfields. Similar to the value threshold and the spatial gradientthreshold, the temporal gradient threshold ma be pre-calibrated tocorrespond to, or exceed, a maximum temporal gradient measured usingknown calibration loading rates. In this way, temporal gradients whichexceed the temporal gradient threshold may be interpreted ascorresponding to unphysically rapid loading rates, which consequentlyare probably due to external interference with the measured force values23.

The strain induced in the layer of piezoelectric material 7 at the pointof a user interaction may depend on the location on the touch panel 1 aswell as the applied force. Similarly, values and spatial or temporalgradients may depend on the location or a user interaction as well asthe applied force. In general, any or all of the value threshold, thespatial gradient threshold and/or the temporal gradient threshold may befunctions of the location of a corresponding user interaction. Inimplementations in which the first circuit 14 also determinescapacitance signals 20, location data 27 corresponding to userinteractions may be conveniently determined using the capacitancesignals 20. Using the capacitance signals 20 to determine userinteraction location data 27 may have the additional advantage of beingindependent of the force values 23.

Determination of coupling to external electric fields using the commonelectrode: In implementations which omit the second circuit 17, thecommon electrode 6 is connected to a system ground or common modevoltage.

However, when the second circuit 17 is connected to the one or morecommon electrodes 6, the second piezoelectric pressure signal 22 may becombined with the first piezoelectric pressure signals 19 to generate anexternal interference detection signal 26 which may be correlated withthe extent of coupling to external electric fields. The externalinterference detection signal 26 may form part of the identification 24of which, if any, of the force values are influenced by coupling toexternal electric fields.

Referring also to FIG. 23, a simplified representation of couplingbetween an object 39 and the electrodes 5, 6, 11 of a touch panel 1 isshown.

Referring also to FIG. 24, a simplified schematic is shown to illustratethe conversion of charges induced on the sensing electrodes 5, 11 andcommon electrode(s) 6 into voltage signals.

An object 39, for example a user's digit, which is proximate to ortouching the touch panel 1 may become charged to a potential V_(int) byelectrostatic charging, or from acting as an antenna for a sourceV_(int) of electromagnetic interference. There is a capacitive couplingC_(ext) between the object 39 and the overall assemblage of all of thesensing electrodes 5, 11 and the common electrode 6. A totalelectrostatic charge Q_(PS) is induced in the overall assemblage of allof the sensing electrodes 5, 11 and the common electrode 6 asapproximately Q_(ES)=C_(ext), V_(int). It should be noted that it maynot be possible to calibrate C_(est) in practice, because the precisegeometry will be continually changing as a user moves their digit and/orstylus in relation to the touch panel 1, and also will vary betweendifferent users and different digits of the same user. Additionally,V_(int) may not be measureable in general. However, determination orestimation of C_(ext) and/or V_(int) is not necessary in order todetermine the external interference detection signal 26.

The following is based on the premise that an unknown, totalelectrostatic charge Q_(ES) induced on the electrodes 5, 6, 11 will bemade up of a sum of individual electrostatic charges induced on each ofthe electrodes 5, 6 11.

Referring to the n^(th) of N first sensing electrodes 5 by thecorresponding physical position y_(n) and the m^(th) of M second sensingelectrodes 11 by the corresponding physical position x_(m), theelectrostatic charge induced on the m^(th) of M second sensingelectrodes 11, x_(m) by the object 39 may be denoted Sx_(m), and soforth. Similarly the electrostatic charge induced on the n^(th) of Nfirst sensing electrodes 5, y_(n) by the object 39 may be denoted Sy_(n)and so forth, and the electrostatic charge induced on the counterelectrode 6 by the object 39 may be denoted S_(CE). The totalelectrostatic charge Q_(ES) may be approximated as:Q _(ES)=Σ_(m=1) ^(M) Sx _(m)+Σ_(n=1) ^(N) Sy _(n) +S _(CE)   (15)

When polarisation P of the piezoelectric material layer 7 is inducedbetween the common electrode 5 and the sensing electrodes x_(m), y_(n),the charges induced on the sensing electrodes x_(m), y_(n) have oppositepolarity to the charges induced on the common electrode 6. In otherwords, external coupling to the object 39 induces charge flow betweensystem ground or common mode voltage and the overall assemblage of allof the electrodes x_(m), y_(n), 6, whereas by contrast a polarisation Pof the piezoelectric material layer 7 induces charges to flow betweenthe counter electrode 6 and the sensing electrodes x_(m), y_(n).

One consequence of this is that charges induced by the polarisation P ofthe piezoelectric material layer 7 are expected to sum to zero, at leastto within a measurement error. For example, if the piezoelectric chargeinduced on the m^(th) of M second sensing electrodes x_(m) by apolarisation P of the piezoelectric material layer 7 is denoted Fx_(m)and so forth, the piezoelectric charge induced on the n^(th) of N firstsensing electrodes y_(n) by a polarisation P of the piezoelectricmaterial layer 7 is denoted Fy_(n) and so forth, and the piezoelectriccharge induced on the counter electrode 6 by a polarisation P of thepiezoelectric material layer 7 is denoted F_(CE), then a total inducedpiezoelectric charge Q_(PT) may be approximated as:Q _(PT)=0=Σ_(m=1) ^(M) Fx _(m)+Σ_(m=1) ^(N) Fy _(n) +F _(CE)   (16)

It may also he noted that the piezoelectric charge F_(CE) induced on thecounter electrode 6 may provide a good measure of the total forceapplied to the touch panel 1.

Referring in particular to FIG. 24, the total charge induced on them^(th) of M second sensing electrodes x_(m), 11 may be written as:Qx _(m) =Sx _(m) +Fx _(m)   (17)

Similarly, the charge induced on the n^(th) of N first sensingelectrodes y_(n), 5 may be written as:Qy _(n) =Sy _(n) +Fy _(n)   (18)

and the charge induced on the counter electrode 6 may be written as:Q _(CE) =S _(CE) +F _(CE)   (19)

In order to generate the external interference signal 26, the chargesQx_(m), Qy_(n) measured on all of the sensing electrodes x_(m), y_(n)are summed with the charge S_(CE) measured on the common electrode 6 toyield:

$\begin{matrix}{{Q_{ext} = {{\sum\limits_{m = 1}^{M}{Qx}_{m}} + {\sum\limits_{n = 1}^{N}{Qy}_{n}} + Q_{CE}}}{Q_{ext} = {{\sum\limits_{m = 1}^{M}\left( {{Sx}_{m} + {Fx}_{m}} \right)} + {\sum\limits_{n = 1}^{N}\left( {{Sy}_{n} + {Fy}_{n}} \right)} + \left( {S_{CE} + F_{CE}} \right)}}{Q_{ext} = {\left( {{\sum\limits_{m = 1}^{M}{Sx}_{m}} + {\sum\limits_{n = 1}^{N}{Sy}_{n}} + S_{CE}} \right) + \left( {{\sum\limits_{m = 1}^{M}{Fx}_{m}} + {\sum\limits_{n = 1}^{N}{Fy}_{n}} + F_{CE}} \right)}}} & (20)\end{matrix}$

In which Q_(ext) is the sum of all the charges measured by the commonelectrode 5 and all of the sensing electrodes x_(m), y_(n). The externalinterference signal may correspond to or be related to the sum Q_(ext).Referring to Equations (15) and (16), under ideal conditions the firstbracketed term of Equation (20) is equal to the total electrostaticcharge Q_(ES) and the second bracketed term of Equation (20) is equal tozero. Under practial, non-ideal conditions, the external interferencesignal may still he approximated to the total electrostatic chargeQ_(ES):Σ_(m=1) ^(M) Qx _(m)+Σ_(m=1) ^(N) Qy _(n) +Q _(CE) =Q _(ext) ≈Q _(ES)  (21)

In practice, the charges Qx_(m), Qy_(n), Q_(CE) may be detected usingcharge amplifiers 40, for example incorporated into the first and secondcircuits 14, 15. A voltage output corresponding to the m^(th) of Msecond sensing electrodes x_(m), 11 may be denoted Vx_(m), and isrelated to Qx_(m), and so forth. Although FIG. 24 illustrates a singlecharge amplifier 40 connected to each electrode 5, 6, 11, this need nothe the case. For example, two or more adjacent first sensing electrodes5 may be connected to a single charge amplifier 40, and similarly forthe second sensing electrodes 11. Furthermore, each electrode 5, 6 11may be connected to additional processing circuitry (not shown) inaddition to being connected to a charge amplifier 40.

Commonly, a charge amplifier 40 will integrate the input current Forexample, if the current on the m^(th) of M second sensing electrodesx_(m) is Ix_(m), then the voltage Vx_(m) on the m^(th) of M secondsensing electrodes x_(m) at a time t may, under ideal conditions, beexpressed as:Vx _(m) =Gx _(m) Qx _(m) =Gx _(m)∫₀ ^(t) Ix _(m)(τ)dτ  (22)

In which Gx_(m) is the gain of the m^(th) of M charge amplifiers 40connected to the M second sensing electrodes x_(m) and τ is anintegration variable. Similarly, the voltage Vy_(n) on the n^(th) of Nfirst sensing electrodes y_(n) may be expressed as:Vy_(n) =Gy _(n) Qy _(n) =Gy _(n)∫₀ ^(t) Iy _(n)(T)dτ  (23)

In which Gy_(n) is the gain of the n^(th) of N charge amplifiers 40connected to the N first sensing electrodes y_(n), Iy_(n) is the currenton the n^(th) of N first sensing electrodes y_(n) and τ is anintegration variable. Similarly, the voltage V_(CE) on the commonelectrode 6 may be expressed as:V _(CE) =G _(CE) Q _(CE) =G _(CE)∫₀ ^(t) I _(CE)(τ)dτ  (24)

In which G_(CE) is the gain of the charge amplifier 40 connected to thecommon electrode 6, I_(CE) is the current on the common electrode 6 andτ is an integration variable. The external interference signal, denotedin this instance as V_(ext), ay be then approximated as the sum of allthe charge amplifier 40 signals:

$\begin{matrix}{{V_{ext} = {{\sum\limits_{m = 1}^{M}{Vx}_{m}} + {\sum\limits_{n = 1}^{N}{Vy}_{n}} + V_{CE}}}{V_{ext} = {{\sum\limits_{m = 1}^{M}{{Gx}_{m}{Qx}_{m}}} + {\sum\limits_{n = 1}^{N}{{Gy}_{n}{Qy}_{n}}} + {G_{CE}Q_{CE}}}}} & (25)\end{matrix}$

If the gains are all substantially equal such thatGx_(m)≈Gy_(n)≈G_(CE)≈G then, the external interference signal 6 in termsof voltage V_(ext), may be expressed as a simple multiple of theexternal interference signal 26 in terms of charge Q_(ext), i.e.V_(est)≈G.Q_(ext). However, in practice, the charge amplifier 40 gainsGx_(m), Gy_(n), G_(CE) will not be precisely identical. Furthermore,each charge amplifier 40 will in practice experience DC offsets anddrift, in addition to time-dependent decay of low frequency and DCcomponents in the voltage output (sometimes referred to as “roll-off”).

Therefore, in practical terms, the external interference signal 26,V_(ext) may be viewed as corresponding to a measurement of the chargeQ_(ES) induced by an interfering source V_(int), plus a noise term:V _(ext)=Σ_(m=1) ^(M) Vx _(m)+Σ_(m=1) ^(N) Vy _(n) +V _(CE) =G _(T) Q_(ES)+ε  (26)

In which G_(γ) is a constant relating to the overall gain of the chargeamplifiers 40 and ε is a term representing the instantaneous error ornoise resulting from the various sources described hereinbefore. Thenoise term ε is thought to be primarily composed of residual componentsof the pressure signals 19, 22 which have not been cancelled out due toslight imbalances in the individual charge amplifier 40 gains Gx_(m),Gy_(n), C_(CE). Although a value of the constant G_(T) might becalibrated, this is unnecessary. All that is needed is to determine asuitable threshold value, V_(thresh), above which it may be reliablydetermined that the external interference signal 26, is detecting theinfluence of an interfering source V_(int).

For example, the touch panel 1 may be placed in a shielded container anda range of input forces applied using a non-conductive stylus orcomparable object 39. Under such circumstances, the total externallyinduced charge Q_(ES) should be approximately zero, such that Equation(26) may be simplified to:V_(ext)≈ε  (27)

After recording a suitable length of signal, spanning a suitable rangeof applied forces, for example between 0.5 N and to N, a suitablethreshold V_(thresh) may be determined based on the measured values ofε. The threshold V_(thresh) may be set as a multiple of the maximumabsolute value of ε recorded. For example, V_(thresh)=1.5×max(|ε|) orV_(thresh)=2×max(|ε|) and so forth.

Alternatively, a standard error may be calculated based on the measuredvalues of ε, and the threshold voltage V_(thresh) may be set as amultiple of the standard error σ_(ε). For example, V_(thresh)=3×σ_(ε)orV_(thresh)=5×σ_(ε).

Subsequently, determining which, if any, of the force values 23 areinfluenced by coupling to external electric fields may include thecontroller 15 or post-processing module 16 obtaining the externalinterference signal V_(ext) and comparing it against the pre-calibratedthreshold value V_(thresh). If the amplitude of the externalinterference signal V_(ext) is less than the threshold V_(thresh), i.e.|V_(ext)|<V_(thresh), then i.e. then the piezoelectric pressure signals19, 22 and corresponding force values 23 are unlikely to besignificantly influenced by an external interference source V_(int).

However, if the amplitude of the external interference signal V_(ext) isgreater than or equal to the threshold V_(thresh), i.e.|V_(ext)|≥V_(thresh), then the piezoelectric pressure signals 19, 22 andcorresponding force values 23 are probably being influenced by anexternal interference source V_(int). In this case, the indication 24may include an interference flag Int_(flag) set to a suitable value suchas, for example, ‘true’, unity, and so forth.

The interference flag Int_(flag) may be used in a number of differentways to determine or contribute to determining which, if any, forcevalues 23 should be flagged as excluded force values 23 b.

In one example, the interference Int_(flag) may be used in conjunctionwith location data 27 corresponding to one or more user interactions tosimply designate all force values 23 which correspond to physicallocations x_(m), y_(n) within a pre-determined distance from a userinteraction location as excluded force values 23 b. The location data 27for user interactions may be determined using the first pressure signals19. However, it may be advantageous to determine the location data 27for user interactions independently of the pressure signals 19, 22 byusing capacitance signals 20 (if these are available). This approach canbe effective because the coupling to a user's digit or similar object 39is typically more localised than the deformation of the layer ofpiezoelectric material 7.

In another example, the interference flag Int_(flag) may be used inconjunction with one or more of the value threshold, the spatialgradient threshold and/or the temporal gradient threshold. For example,force values 23 may be compared against a first value threshold when theinterference flag Int_(flag) is unset, and compared against a second,lower, value threshold when the interference flag Int_(flag) is set. Inthis way, a lower value threshold may be applied when the externalinterference signal V_(ext) indicates a high probability of unwantedcoupling to external electric fields. Similar dual thresholds may alsobe used for the spatial and/or temporal gradient thresholds.

Designation of a particular force value 23 as an excluded force value 23b may be dependent on exceeding multiple thresholds as the same time.For example, a force value 23 may be excluded if two out of die valuethreshold, the spatial gradient threshold and the temporal gradientthreshold are exceeded at the same time. In another example, a forcevalue 23 may be excluded if any one of the value threshold, the spatialgradient threshold and the temporal gradient threshold is exceeded atthe same time that the interference flag Int_(flag) is set to a value oftrue, unity and so forth.

Modifications

It will be appreciated that many modifications may be made to theembodiments hereinbefore described. Such modifications may involveequivalent and other features which are already known in the design,manufacture and use of piezoelectric pressure sensing touch panels,capacitive touch panels or combined piezoelectric pressure andcapacitive touch panels, and which may be used instead of or in additionto features already described herein. Features of one embodiment may bereplaced or supplemented by features of another embodiment.

In the preceding examples, the interpolation of estimated force valuesF_(est)(x′_(m)), F_(est)(y′_(n)) has been described as being independentin x- and y-directions. However, in some implementations,two-dimensional interpolation may be used to determine estimated forcevalues F_(est) (x′_(m), y′_(n)) using an interpolation surface. Forexample, by applying the two-dimensional form of Lagrange interpolation.

Unconditional Interpolation

Examples have been described hereinbefore in which the exclusion of oneor more force values 23, F(xm), F(yn) as excluded force values 23 b isconditional upon receiving and/or determining that those force values23, F(xm), F(yn) are, or are likely to be, influenced by coupling toexternal electric fields.

However, since the coupling of noise into the system via a user's digitor stylus is typically more localised than the deflection of the touchpanel 1, an alternative approach is to simply set all force values 23,F(xm), F(yn) corresponding to physical locations within a predeterminedor dynamically determined threshold distance dexc of at least onelocation corresponding to a user touch (alternatively a “user touchlocation”) to be as excluded force values 23 b. The force values 23,F(xm), F(yn) corresponding to physical locations outside the thresholddistance dexc of any user touch locations are set as valid force values23 a. Reconstructed force values 25 may then be calculated according toany of the methods described hereinbefore.

User touch locations may be determined from, for example, the touchlocation data 27. Touch location data 27 may be determined based on thefirst pressure signals 19, and optionally the second pressure signals22, as described hereinbefore. Additionally or alternatively, the touchlocation data 27 may be determined based on capacitance signals 20, whenavailable. The touch location data 27 may be determined based on acombination of the first pressure signals 19 and the capacitance signals20.

The value of the threshold distance dexo used will depend on thespecific touch panel 1 used, amongst other factors. The precisethreshold distance dexc to use may be predetermined, based on similarcalibration experiments to those described hereinbefore. Alternatively,the value of the threshold distance dcxc used to determine which forcevalues 23, F(xm), F(yn) to exclude may be dynamically determined in use.In some examples, the controller 15, the post-processing module 16and/or an operating system of a device incorporating the touch panel 1may vary the value of the threshold distance dexc based on the currentoperating environment. For instance, in examples for which the externalinterference signal Vext determined, the threshold distance dexc may beincreased in response to an increase in the external interference signalVext indicating increased levels of external noise, and vice-versa.

Suitable values for the threshold distances dexc may span a rangebetween one and several times a typical diameter of the contact area ofa user's digit or stylus. For example, the threshold distance dexc mayvary between 5 mm and 40 mm, inclusive of the end-points. Whencapacitive measurements are included, these may be used to estimate thecontact area of a user's digit or stylus in order to adapt the thresholddistance d_(exc) to the size of a user's digit or stylus.

Although claims have been formulated in this application to particularcombinations of features, it should be understood that the scope of thedisclosure of the present invention also includes any novel features orany novel combination of features disclosed herein either explicitly orimplicitly or any generalization thereof, whether or not it relates tothe same invention as presently claimed in any claim and whether or notit mitigates any or all of the same technical problems as does thepresent invention, The applicant hereby gives notice that new claims maybe formulated to such features andlor combinations of such featuresduring the prosecution of the present application or of any furtherapplication derived therefrom.

What is claimed is:
 1. A method comprising: receiving, from a touchpanel, force values corresponding to a plurality of piezoelectricsensors, each piezoelectric sensor corresponding to a physical locationon the touch panel; receiving one or more user touch locationscorresponding to user touches; excluding all force values correspondingto physical locations within a distance of a user touch location, andsetting the remaining force values as valid force values; andinterpolating and/or extrapolating, based on the valid force values, oneor more reconstructed force values corresponding to the same physicallocations as the respective excluded force values.
 2. The methodaccording to claim 1, wherein receiving the one or more user touchlocations comprises: receiving, from the touch panel, capacitive touchinformation; and determining the one or more user touch locations basedon the capacitive touch information.
 3. The method according to claim 1,wherein receiving the one or more locations corresponding to usertouches comprises determining the one or more user touch locations basedon pressure signals received from the plurality of piezoelectricsensors.
 4. The method according to claim 1, wherein the plurality ofpiezoelectric sensors comprise a layer of piezoelectric materialdisposed between a plurality of sensing electrodes and at least onecommon electrode, each piezoelectric sensor formed of a sensingelectrode and a common electrode; the method further comprisingreceiving an external interference signal which is a sum over signalsreceived from all of the sensing electrodes and the, or each, commonelectrode; in response to the external interference signal exceeds apre-determined external interference threshold, setting a global flag;and in response to the global flag being set, excluding all force valuescorresponding to physical locations with a predetermined distance of auser touch location.
 5. The method according to claim 1, wherein thedistance is a predetermined distance.
 6. The method according to claim1, wherein the distance is a dynamically determined distance.
 7. Themethod according to claim 1, wherein interpolating and/or extrapolatingone or more reconstructed force values comprises performing polynomialinterpolation based on the valid force values and the respectivephysical locations.
 8. The method according to claim ₇, whereininterpolating and/or extrapolating one or more reconstructed forcevalues comprises: determining a set of interpolation locations, thenumber of interpolation locations being equal to the number of forcevalues received, wherein the interpolation locations have a higherspatial density towards the edges of the touch panel than the physicallocations; determining an estimated force value for some or all of theinterpolation locations by interpolating or extrapolating the validforce values from two or more physical locations proximate to orspanning the interpolation location; performing polynomial interpolationusing the estimated force values and the corresponding interpolationlocations; and determining the one or more reconstructed force valuesusing the polymer interpolant.
 9. The method according to claim 8,wherein determining an estimated force value for some or all of theinterpolation locations comprises determining an estimated force valuefor every interpolation location.
 10. The method according to claim 8,wherein determining an estimated force value for some or all of theinterpolation locations comprises: determining an estimated force valuefor each interpolation location which is spanned by a pair of adjacentphysical locations which both correspond to valid force values; anddetermining an estimated force value for each interpolation locationwhich is within a predetermined distance of a physical locationcorresponding to a valid force value.
 11. The method according claim 8,wherein determining an estimated force value for some or all of theinterpolation locations comprises: determining an estimated force valuefor each interpolation location which corresponds to a valid forcevalue.
 12. The method according to claim 1, wherein the plurality ofpiezoelectric sensors comprise a layer of piezoelectric materialdisposed between a plurality of sensing electrodes and at least onecommon electrode, each piezoelectric sensor formed of a sensingelectrode and a common electrode, and wherein the method furthercompriseswhercin: in response to a user touch location is at or lessthan a predetermined distance from an edge of the touch panel, receivingan external interference signal which is a sum over signals receivedfrom all of the sensing electrodes and the, or each, common electrode;in response to the external interference signal exceeding apre-determined external interference threshold, setting a global flag;and in response to the global flag being set, excluding all force valuescorresponding to physical locations within a predetermined distance of auser touch location.
 13. The method according to claim 8, wherein eachestimated force value is determined by: a) performing a linearinterpolation based on a first physical location which corresponds to avalid force value, and a second physical location which is the closestphysical location preceding the first physical location andcorresponding to a valid force value; or b) performing a linearinterpolation based on the first physical location and a third physicallocation which is the closest physical location following the firstphysical location and corresponding to a valid force value; wherein thefirst physical location is the physical location of a valid force valuewhich corresponds to, or is closest to, the interpolation location;wherein the selection of steps a) or b) is made in dependence uponcomparing a cost function calculated for the first and second physicallocations with a cost function calculated for the first and thirdphysical locations.
 14. The method according to claim 8, wherein a firstphysical location is a physical location of a valid force value whichcorresponds to, or is closest to, an interpolation location, and whereineach estimated force value is determined by: a) performing a linearinterpolation based on a first pair of physical locations which areclosest to the first physical location in any direction; or b)performing a linear interpolation based on a second pair of physicallocations corresponding to the physical location which corresponds to avalid pressure value immediately preceding the first physical location,and the physical location which corresponds to a valid pressure valueimmediately following the first physical location; wherein the selectionof steps a) or b) is made in dependence upon comparing a cost functioncalculated for the first pair of physical locations with a cost functioncalculated for the second pair of physical locations.
 15. The methodaccording to claim 1, wherein interpolating and/or extrapolating one ormore reconstructed force values comprises fitting a force value model tothe valid force values and the respective physical locations.
 16. Themethod according to claim 1, wherein interpolating and/or extrapolatingone or more reconstructed force values comprises determining a splineinterpolant passing through each of the valid force values and therespective physical locations.
 17. A computer program stored on anon-transitory computer readable medium and comprising instructions forcausing a data processing apparatus to execute a method according toclaim
 1. 18. An apparatus configured: to receive force valuescorresponding to a plurality of piezoelectric sensors, eachpiezoelectric sensor corresponding to a physical location on a touchpanel; to receive one or more user touch locations corresponding to usertouches; to exclude all force values corresponding to physical locationswithin a distance of a user touch location, and to set the remainingforce values as valid force values; and to interpolate and/orextrapolate, based on the valid force values, one or more reconstructedforce values corresponding to the same physical locations as therespective excluded force values.
 19. The apparatus of claim 18 furthercomprising: a touch panel comprising a plurality of piezoelectricsensors.